キーワード:
米国電気電子学会, "Institute of Electrical and Electronics Engineers", IEEE
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2020,
Alil SM, Cheab S, Socheatra S, Jeoti V, Saeidi T, Abidin ZZ
2020 IEEE Student Conference on Research and Development (SCOReD), Batu Pahat, Johor, Malaysia. IEEE: 284-288; ISBN 978-1-7281-9318-2
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2020,
Qureshi SA, Ashyap AYI, Abidin ZZ, Dahlan SH, Shah SM, Yee SK, Majid HA, See CH
2020 IEEE Student Conference on Research and Development (SCOReD), Batu Pahat, Johor, Malaysia. IEEE: 28-32; ISBN 978-1-7281-9318-2
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2020,
Ruslan AA, Mohamad SY, Abdul Malek NF, Yusoff SH, Ibrahim SN, Mohd Isa FN
2020 IEEE Student Conference on Research and Development (SCOReD), Batu Pahat, Johor, Malaysia. IEEE: 1-5; ISBN 978-1-7281-9318-2
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2020,
Perova I, Litovchenko O, Zavgorodnii I, Brazhnykova Y, Kovalenko A
2020 IEEE Ukrainian Microwave Week (UkrMW), Kharkiv, Ukraine. IEEE: 594-598; ISBN 978-1-7281-7314-6
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2020,
Kovalenko O, Kalinichenko S, Babich E, Kivva F, Roenko A, Antusheva T
2020 IEEE Ukrainian Microwave Week (UkrMW), Kharkiv, Ukraine. IEEE: 603-607; ISBN 978-1-7281-7314-6
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2020,
Romanenko S, Harvey AR, Hool L, Wallace VP
2020 IEEE Ukrainian Microwave Week (UkrMW), Kharkiv, Ukraine. IEEE: 612-616; ISBN 978-1-7281-7314-6
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2020,
Kovalenko O, Kivva F, Roenko A
2020 IEEE Ukrainian Microwave Week (UkrMW), Kharkiv, Ukraine. IEEE: 608-611; ISBN 978-1-7281-7314-6
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2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Rome, Italy. IEEE: 1-5; ISBN 978-1-7281-5580-7
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2020,
Dergham I, Martinez Rocha JC, Imad R, Alayli Y
2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Rome, Italy. IEEE: 1-5; ISBN 978-1-7281-5580-7
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2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Rome, Italy. IEEE: 1-4; ISBN 978-1-7281-5580-7
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2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Rome, Italy. IEEE: 1-6; ISBN 978-1-7281-5580-7
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2020,
Ramos V, Trillo AM, Suarez OJ, Suarez S, Febles VM, Rabassa LE, Karpowicz J, Fernandez de Aldecoa JC, Hernandez JA
2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Rome, Italy. IEEE: 1-5; ISBN 978-1-7281-5580-7
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2020,
Simonazzi M, Sandrolini L, Reggiani U
2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Rome, Italy. IEEE: 1-5; ISBN 978-1-7281-5580-7
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2020,
Song X, Yue Y, Zhu X, Chang H
2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Rome, Italy. IEEE: 1-4; ISBN 978-1-7281-5580-7
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2020,
Bonato M, Dossi L, Chiaramello E, Fiocchi S, Gallucci S, Tognola G, Ravazzani P, Parazzini M
2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Rome, Italy. IEEE: 1-4; ISBN 978-1-7281-5580-7
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2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Rome, Italy. IEEE: 1-4; ISBN 978-1-7281-5580-7
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2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Rome, Italy. IEEE: 1-4; ISBN 978-1-7281-5580-7
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2020,
Miwa K, Takenaka T, Hirata A
2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Rome, Italy. IEEE: 1-4; ISBN 978-1-7281-5580-7
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2020,
Onishi T, Niskala K, Christ A, Roman J
2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Rome, Italy. IEEE: 1-4; ISBN 978-1-7281-5580-7
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2020,
Gravina A, Moglie F, Bastianelli L, Mariani Primiani V
2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Rome, Italy. IEEE: 1-6; ISBN 978-1-7281-5580-7
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2020,
Chen IF, Peng CM, Liu HA, Chen YM
2020 International Workshop on Electromagnetics: Applications and Student Innovation Competition (iWEM), Makung, Penghu, Taiwan. IEEE: 1-2; ISBN 978-1-7281-9990-0
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2020,
Cruciani S, Campi T, Maradei F, Feliziani M
2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Rome, Italy. IEEE: 1-4; ISBN 978-1-7281-5580-7
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2020,
Kamimura Y, Daimon K, Matsumoto N, Kimura S, Sato K
2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Rome, Italy. IEEE: 1-4; ISBN 978-1-7281-5580-7
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2020,
Kyun Woo M, DelaBarre L, Lee BY, Waks M, Lagore RL, Radder J, Eryaman Y, Ugurbil K, Adriany G
IEEE Access 8: 203555-203563
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2020,
Di Francesco A, De Santis V
2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Rome, Italy. IEEE: 1-5; ISBN 978-1-7281-5580-7