キーワード:
比吸収率, "Spezifische Absorptionsrate", SAR, "specific energy absorption rate", "specific absorption rate", 比エネルギー吸収率
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2019,
Ebadi-Shahrivar A, Fay P, Hochwald BM, Love DJ
2019 IEEE International Symposium on Antennas and Propagation and USNC-URSI Radio Science Meeting, Atlanta, GA, USA. IEEE: pp. 1005-1006; ISBN 978-1-7281-0693-9
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2019,
Lan Q, Zheng J, Chen J
2019 IEEE International Symposium on Antennas and Propagation and USNC-URSI Radio Science Meeting, Atlanta, GA, USA. IEEE: pp. 1861-1862; ISBN 978-1-7281-0693-9
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2019,
Phaneuf M, Mojabi P
2019 IEEE International Symposium on Antennas and Propagation and USNC-URSI Radio Science Meeting, Atlanta, GA, USA. IEEE: pp. 533-534; ISBN 978-1-7281-0693-9
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2019,
Song S, Zheng J, Chen J
2019 IEEE International Symposium on Antennas and Propagation and USNC-URSI Radio Science Meeting, Atlanta, GA, USA. IEEE: pp. 1009-1010; ISBN 978-1-7281-0693-9
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2019,
Shiina T, Yamazaki K
2019 Joint International Symposium on Electromagnetic Compatibility, Sapporo and Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Sapporo/APEMC), Sapporo, Japan. IEEE: pp. 744-747; ISBN 978-1-7281-1639-6
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2019 Joint International Symposium on Electromagnetic Compatibility, Sapporo and Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Sapporo/APEMC), Sapporo, Japan. IEEE: pp. 691-694; ISBN 978-1-7281-1639-6
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2019,
Ahmed S, Mehmood A, Sydänheimo L, Ukkonen L, Björninen T
2019 IEEE International Conference on RFID Technology and Applications (RFID-TA), Pisa, Italy. IEEE: pp. 231-235; ISBN 978-1-7281-0590-1
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2019,
Andrenko AS, Shimizu Y, Wake K
2019 IEEE International Conference on RFID Technology and Applications (RFID-TA), Pisa, Italy. IEEE: pp. 297-300; ISBN 978-1-7281-0590-1
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Radiologe 59 (10): 894-897
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IEEE Access 7: 162062 - 162069
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German Commission on Radiological Protection (SSK),
1-65
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2019,
Cui W, Liu R, Wang L, Wang M, Zheng H, Li EP
IEEE Antennas Wirel Propag Lett 18 (12): 2706-2710
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2019,
Ahmed S, Sydänheimo L, Ukkonen L, Björninen T
2019 International Conference on Electromagnetics in Advanced Applications (ICEAA), Granada, Spain. IEEE: pp. 55-59; ISBN 978-1-7281-0564-2
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2019,
Atanasov NT, Atanasova GL, Stefanov AK, Nedialkov II
2019 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP), Bochum, Germany. IEEE: pp. 67-69; ISBN 978-1-7281-0937-4
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2019 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Barcelona, Spain. IEEE: pp. 1020-1024; ISBN 978-1-7281-0595-6
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2019,
Vrba D, Vrba J, Rodrigues DB, Stauffer P
2019 European Microwave Conference in Central Europe (EuMCE), Prague, Czech Republic. IEEE: pp. 440-443; ISBN 978-1-7281-1240-4
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2019,
Nikolayev D, Joseph W, Skrivervik AK, Zhadobov M, Martens L, Sauleau R
IEEE Antennas Wirel Propag Lett 18 (12): 2686-2690
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2019,
Bulla G, de Salles AA, Fernández-Rodríguez C
2019 European Microwave Conference in Central Europe (EuMCE), Prague, Czech Republic. IEEE: pp. 54-57; ISBN 978-1-7281-1240-4
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2019,
Vrba J, Vojáčková L, Fišer O, Vrba D, Vrba J
2019 European Microwave Conference in Central Europe (EuMCE), Prague, Czech Republic. IEEE: pp. 444-447; ISBN 978-1-7281-1240-4
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2019,
Khan SR, Desmulliez MPY
2019 IEEE-APS Topical Conference on Antennas and Propagation in Wireless Communications (APWC), Granada, Spain. IEEE: pp. 59-62; ISBN 978-1-7281-0567-3
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2019,
Nefzi A, Carr L, Arnaud-Cormos D, Leveque P
2019 European Microwave Conference in Central Europe (EuMCE), Prague, Czech Republic. IEEE: pp. 631-634; ISBN 978-1-7281-1240-4
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2019,
Durdik M, Kosik P, Markova E, Somsedikova A, Gajdosechova B, Nikitina E, Horvathova E, Kozics K, Davis D, Belyaev I
Sci Rep 9: 16182
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2019,
Orlacchio R, Le Page Y, Le Dréan Y, Le Guével R, Sauleau R, Alekseev S, Zhadobov M
Sci Rep 9: 15249
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2019,
Stankovic V, Markovic V, Jovanovic D, Krstic D, Cvetkovic N
IEEE EUROCON 2019 -18th International Conference on Smart Technologies, Novi Sad, Serbia. IEEE: pp. 1-4; ISBN 978-1-5386-9302-5
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2019,
Illahi U, Iqbal J, Sulaiman MI, Alam MM, Su’Ud MM, Jamaluddin MH, Yasin MNM
IEEE Access 7: 150573 - 150582