キーワード:
比吸収率, "Spezifische Absorptionsrate", SAR, "specific energy absorption rate", "specific absorption rate", 比エネルギー吸収率
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2006,
Simko M, Hartwig C, Lantow M, Lupke M, Mattsson MO, Rahman Q, Rollwitz J
Toxicol Lett 161 (1): 73-82
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2005,
Brooks DR, Nicol S, Wojcik J
16th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 97-102; ISBN 978-1-5090-3198-6
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2005,
Okano Y, Sugama Y, Abe M
16th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 161-166; ISBN 978-1-5090-3198-6
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16th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 145-150; ISBN 978-1-5090-3198-6
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2005,
Anzaldi G, Delgado EC, Riu PJ, Silva F
16th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 155-160; ISBN 978-1-5090-3198-6
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2005,
Bitz A, El Ouardi A, Streckert J, Hansen V
16th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 115-118; ISBN 978-1-5090-3198-6
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2005,
Meyer FJC, van Wyk MJ, Kellerman RA
16th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 111-114; ISBN 978-1-5090-3198-6
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16th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 123-126; ISBN 978-1-5090-3198-6
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2005,
Francavilla M, Schiavoni A
16th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 107-110; ISBN 978-1-5090-3198-6
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2005,
Ibrahiem A, Dale C, Tabbara W, Wiart J
Prog Electromagn Res 52: 23-46