キーワード:
"reference levels", "Abgeleitete Grenzwerte", Referenzwerte, 参考レベル
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2014 International Symposium on Electromagnetic Compatibility, Tokyo, Japan. IEEE: pp. 348-353; ISBN 978-4-88552-287-1
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2014,
Karabetsos E, Kalampaliki E, Koutounidis D
IEEE Vehicular Technology Magazine 9 (4): 34-39
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2014,
Choi DG, Kim KH, Jang JD, Chung SY, Gimm YM
2014 International Symposium on Electromagnetic Compatibility, Tokyo, Japan. IEEE: pp. 638-641; ISBN 978-4-88552-287-1
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2014 International Symposium on Electromagnetic Compatibility, Tokyo, Japan. IEEE: pp. 194-197; ISBN 978-4-88552-287-1
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2014,
Iwamoto T, Arima T, Uno T, Iwamoto T, Wake K, Fujii K, Watanabe S
2014 International Symposium on Electromagnetic Compatibility, Tokyo, Japan. IEEE: pp. 529-532; ISBN 978-4-88552-287-1
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2014,
Miyaji Y, Shimada M, Mizuno Y, Naito K
2014 International Symposium on Electromagnetic Compatibility, Tokyo, Japan. IEEE: pp. 621-624; ISBN 978-4-88552-287-1
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German Commission for Electrical, Electronic & Information Technologies of DIN and VDE (DKE),
DIN EN 50413/A1 VDE 0848-1/A1:2014-07
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2014,
Song HJ, Shin H, Lee HB, Yoon JH, Byun JK
IEEE Trans Magn 50 (2): 7025804
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2014,
Verloock L, Joseph W, Goeminne F, Martens L, Verlaek M, Constandt K
Measurement 56: 50-57
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2014,
Verloock L, Joseph W, Goeminne F, Martens L, Verlaek M, Constandt K
Health Phys 107 (6): 503-513
