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43件の論文が見つかりました。
キーワード:
"atomic force microscopy", Rasterkraftmikroskopie, "scanning force microscopy", 走査型フォース顕微鏡法, 原子間力顕微鏡
2024 ,
Temperini ME, Polito R, Venanzi T, Baldassarre L, Hu H, Ciracì C, Pea M, Notargiacomo A, Mattioli F, Ortolani M, Giliberti V
Nano Lett 24 (32): 9808-9815
2024 ,
Eşmekaya MA, Gürsoy G, Coşkun A
Electromagn Biol Med 43 (3): 176-186
2024 ,
Ivanov YD, Shumov ID, Kozlov AF, Valueva AA, Ershova MO, Ivanova IA, Ableev AN, Tatur VY, Lukyanitsa AA, Ivanova ND, Ziborov VS
Micromachines 15 (4): 499
2022 ,
Ivanov YD, Tatur VY, Shumov ID, Kozlov AF, Valueva AA, Ivanova IA, Ershova MO, Ivanova ND, Stepanov IN, Lukyanitsa AA, Ziborov VS
J Funct Biomater 13 (4): 234
2022 ,
Gorobets S, Gorobets O, Gorobets Y, Bulaievska M
Bioelectromagnetics 43 (2): 119-143
2020 ,
Han SJ, Moon D, Park MY, Kwon S, Noh M, Jang J, Lee JB, Kim KS
Skin Res Technol 26 (6): 914-922
2020 ,
Ivanov YD, Pleshakova TO, Shumov ID, Kozlov AF, Ivanova IA, Valueva AA, Tatur VY, Smelov MV, Ivanova ND, Ziborov VS
Sci Rep 10: 9022
2019 ,
Chafai DE, Sulimenko V, Havelka D, Kubínová L, Dráber P, Cifra M
Adv Mater 31 (39): e1903636
2019 ,
Zheng Y, Wang Q, Yang X, Nie W, Zou L, Liu X, Wang K
Anal Chem 91 (3): 1954-1961
2018 ,
Wang F, Wang Y, Huang T, Guo F, Liu J, Song Z, Weng Z, Wang Z, Wang Z
2017 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO), Shanghai, China. IEEE: pp. 174-177; ISBN 978-1-5386-1082-4
