キーワード:
"Institute of Electrical and Electronics Engineers", IEEE, 米国電気電子学会
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1979 IEEE International Symposium on Electromagnetic Compatibility, San Diego, CA, USA. IEEE: pp. 385-391; ISBN 978-1-5090-3165-8
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1979,
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1979 IEEE International Symposium on Electromagnetic Compatibility, San Diego, CA, USA. IEEE: pp. 252-256; ISBN 978-1-5090-3165-8
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1979,
Meyerhoff JL, Gandhi OP, Jacobi JH, Lenox RH
IEEE Trans Microw Theory Tech 27 (3): 267-270
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1979,
Durney CH, Iskander MF, Massoudi H, Johnson CC
IEEE Trans Microw Theory Tech 27 (8): 758-763
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1979,
Kritikos HN, Schwan HP
IEEE Trans Biomed Eng 26 (1): 29-34
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1979,
Barber PW, Gandhi OP, Hagmann MJ, Chatterjee I
IEEE Trans Biomed Eng 26 (7): 400-405
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1979,
Peterson DJ, Partlow LM, Gandhi OP
IEEE Trans Biomed Eng 26 (7): 428-436
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IEEE Trans Biomed Eng 26 (4): 238-243
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1978,
Kantor G, Witters DM, Greiser JW
IEEE Trans Microw Theory Tech 26 (8): 563-568
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IEEE Transactions on Power Apparatus and Systems PAS-97 (1): 19-32
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1978,
Delaplace LR, Reilly JP
IEEE Transactions on Power Apparatus and Systems PAS-97 (6): 2243-2252
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IEEE Trans Biomed Eng 25 (5): 467-473
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1978,
Piontek GE, Cain CA, Milner JA
IEEE Trans Microw Theory Tech 26 (8): 535-540
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1978,
Ping-Kwong L, Cain CA, Ducoff HS
IEEE Trans Microw Theory Tech 26 (8): 530-534
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1978,
Brown PV, Lenox RH, Meyerhoff JL
IEEE Trans Biomed Eng 25 (2): 205-208
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1978,
Robinson JE, Cheung AY, Samaras GM, McCulloch D
IEEE Trans Microw Theory Tech 26 (8): 546-549
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IEEE Trans Microw Theory Tech 26 (3): 141-147
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IEEE Trans Microw Theory Tech 26 (8): 613-617
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1978,
Cain CA, Rissmann WJ
IEEE Trans Biomed Eng 25 (3): 288-293
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IEEE Trans Biomed Eng 25 (4): 397-400
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1978,
Kaune WT, Phillips RD, Hjeresen DL, Richardson RL, Beamer JL
IEEE Trans Biomed Eng 25 (3): 276-283
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1978,
Tucker RD, Schmitt OH
IEEE Trans Biomed Eng 25 (6): 509-518
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1978,
Foster KR, Kritikos HN, Schwan HP
IEEE Trans Biomed Eng 25 (3): 313-316
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1977,
Lin JC, Guy AW, Caldwell LR
IEEE Trans Microw Theory Tech 25 (10): 833-836
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1977,
Kantor G, Witters DM, Greiser JW
1977 IEEE MTT-S International Microwave Symposium Digest, San Diego, CA, USA. IEEE: pp. 364-368