キーワード:
"Institute of Electrical and Electronics Engineers", IEEE, 米国電気電子学会
-
2018,
Tarnaud T, Tanghe E, Haesler S, Lopez CM, Martens L, Joseph W
2018 40th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Honolulu, HI, USA. IEEE: pp. 2166-2169; ISBN 978-1-5386-3647-3
-
2018,
Hao D, Zhou Y, Gao P, Yang L, Yang Y, Chen F
2018 40th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Honolulu, HI, USA. IEEE: pp. 2174-2177; ISBN 978-1-5386-3647-3
-
2018,
Shah AA, Alonso F, Vogel D, Wardell K, Coste J, Lemaire JJ, Pison D, Hemm S
2018 40th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Honolulu, HI, USA. IEEE: pp. 2222-2225; ISBN 978-1-5386-3647-3
-
2018,
Zaeimbashi M, Wang Z, Lee SW, Cash S, Fried S, Sun N
2018 40th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Honolulu, HI, USA. IEEE: pp. 2230-2233; ISBN 978-1-5386-3647-3
-
2018,
Al-Kaysi AM, Al-Ani A, Galvez V, Colleen Loo K, Ling S, Tjeerd Boonstra W
2018 40th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Honolulu, HI, USA. IEEE: pp. 3677-3680; ISBN 978-1-5386-3647-3
-
2018,
Wang L, Yang J, Wang F, Zhou P, Wang K, Ming D
2018 40th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Honolulu, HI, USA. IEEE: pp. 259-262; ISBN 978-1-5386-3647-3
-
2018,
Asan AS, Gok S, Sahin M
2018 40th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Honolulu, HI, USA. IEEE: pp. 2252-2255; ISBN 978-1-5386-3647-3
-
2018,
Im C, Seo H, Jun SC
2018 40th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Honolulu, HI, USA. IEEE: pp. 3092-3095; ISBN 978-1-5386-3647-3
-
2018 40th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Honolulu, HI, USA. IEEE: pp. 4764-4767; ISBN 978-1-5386-3647-3
-
2018,
Arima T, Murakami Y, Uno T
2018 IEEE Conference on Antenna Measurements & Applications (CAMA), Västerås, Sweden. IEEE: pp. 1-2; ISBN 978-1-5386-5796-6
-
2018,
Messaoudi H, Aguili T
2018 6th International Conference on Multimedia Computing and Systems (ICMCS), Rabat, Morocco. IEEE: pp. 1-6; ISBN 978-1-5386-6221-2
-
2018,
Patwardhan R, Sonawane S, Harsh R, Gaikwad S
2018 International Conference On Advances in Communication and Computing Technology (ICACCT), Sangamner. IEEE: pp. 616-618; ISBN 978-1-5386-0927-9
-
2018,
Paolini G, Masotti D, Costanzo A
2018 EMF-Med 1st World Conference on Biomedical Applications of Electromagnetic Fields (EMF-Med), Split, Croatia. IEEE: pp. 1-2; ISBN 978-1-5386-5922-9
-
2018,
Foged L, Rodriguez V, Fordham J, Monebhurrun V
2018 IEEE Conference on Antenna Measurements & Applications (CAMA), Västerås, Sweden. IEEE: pp. 1-2; ISBN 978-1-5386-5796-6
-
2018,
Zharkova LP, Romanchenko IV, Buldakov MA, Priputnev PV, Bolshakov MA, Rostov VV
2018 20th International Symposium on High-Current Electronics (ISHCE), Tomsk, Russia. IEEE: pp. 158-161; ISBN 978-1-5386-6892-4
-
2018,
Knyazeva IR, Medvedev MA, Kutenkov OP, Vasilev AV, Gorokhovsky AA, Rostov VV
2018 20th International Symposium on High-Current Electronics (ISHCE), Tomsk, Russia. IEEE: pp. 94-97; ISBN 978-1-5386-6892-4
-
2018,
Soldati M, Mikkonen M, Laakso I, Murakami T, Ugawa Y, Hirata A
Phys Med Biol 63 (22): 225006
-
2018,
Vilaaosh Z, Lajevardipour A, Wood A
2018 43rd International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), Nagoya, Japan. 第第11版; IEEE: pp. 1-2; ISBN 978-1-5386-3810-1
-
2018,
Clemens M, Zang M, Alsayegh B, Schmuelling B
2018 IEEE International Magnetics Conference (INTERMAG), Singapore. IEEE: p. 1; ISBN 978-1-5386-6426-1
-
2018,
Houran MA, Yang X, Chen W, Samizadeh M
2018 International Power Electronics Conference (IPEC-Niigata 2018 -ECCE Asia), Niigata, Japan. IEEE: pp. 1062-1066; ISBN 978-1-5386-4190-3
-
2018 International Power Electronics Conference (IPEC-Niigata 2018 -ECCE Asia), Niigata, Japan. IEEE: pp. 2569-2575; ISBN 978-1-5386-4190-3
-
2018,
Kodera S, Hirata A, Funahashi D, Watanabe S, Jokela K, Croft RJ
IEEE Access 6: 65737 - 65746
-
2018,
Yamazaki S, Harata M, Idehara T, Konagaya K, Yokoyama G, Hoshina H, Ogawa Y
2018 43rd International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), Nagoya, Japan. 第第11版; IEEE: pp. 1-2; ISBN 978-1-5386-3810-1
-
2018,
Yaekashiwa N, Otsuki S, Yoshida H, Hayashi S, Kawase K
2018 43rd International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), Nagoya, Japan. 第第11版; IEEE: pp. 1-2; ISBN 978-1-5386-3810-1
-
2018,
Peralta XG, Cantu JC, Cerna CZ, Echchgadda I
2018 43rd International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), Nagoya, Japan. 第第11版; IEEE: p. 1; ISBN 978-1-5386-3810-1