キーワード:
"Institute of Electrical and Electronics Engineers", IEEE, 米国電気電子学会
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2018,
Sowa P, Cieslar G, Sieron A, Sieron K
2018 Baltic URSI Symposium (URSI), Poznan, Poland. IEEE: 7-8; ISBN 978-1-5386-1360-3
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2018,
Kurta E, Kovačević Ž, Gurbeta L, Badnjević A
2018 7th Mediterranean Conference on Embedded Computing (MECO), Budva, Montenegro. IEEE: 1-4; ISBN 978-1-5386-5684-6
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2018,
Sieron K, Sieron A, Cieslar G, Sowa P
2018 Baltic URSI Symposium (URSI), Poznan, Poland. IEEE: 9-10; ISBN 978-1-5386-1360-3
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2018,
Wenger C, Miranda PC, Salvador R, Thielscher A, Bomzon Z, Giladi M, Mrugala MM, Korshoej AR
IEEE Rev Biomed Eng 11: 195-207
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2018,
Schmidt C, van Rienen U
IEEE Trans Biomed Eng 65 (8): 1828-1839
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2018,
Bhonsle S, Lorenzo MF, Safaai-Jazi A, Davalos RV
IEEE Trans Biomed Eng 65 (10): 2190-2201
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2018,
Zhang B, Kuang D, Tang X, Mi Y, Luo Q, Song G
IEEE Trans Biomed Eng 65 (9): 2093-2100
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2018,
Smondrk M, Benova M, Psenakova Z
2018 ELEKTRO, Mikulov, Czech Republic. IEEE: 1-5; ISBN 978-1-5386-4760-8
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2018,
Paganoto PS, Hagedorn MP, da Silva JR
2017 IEEE 3rd Global Electromagnetic Compatibility Conference (GEMCCON), Sao Paulo, Brazil. IEEE: 1-5; ISBN 978-1-5386-2992-5
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2018,
Kosterec M, Kurimský J, Vargová B
2018 19th International Scientific Conference on Electric Power Engineering (EPE), Brno, Czech Republic. IEEE: 1-6; ISBN 978-1-5386-4613-7
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2018,
Tayel MB, Abouelnaga TG, Elnagar A
2018 5th International Conference on Electrical and Electronic Engineering (ICEEE), Istanbul, Turkey. IEEE: 323-328; ISBN 978-1-5386-6393-6
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2018,
Douglas MG, Pfeifer S, Kuehn S, Neufeld E, Pokovic K, Carrasco E, Samaras T, Christ A, Capstick M, Kuster N
2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (EMC/APEMC), Suntec City, Singapore. IEEE: 92-94; ISBN 978-1-5090-3955-5
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2018,
Fukui S, Maeda N, Xiao F, Kami Y
2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (EMC/APEMC), Suntec City, Singapore. IEEE: 331-335; ISBN 978-1-5090-3955-5
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2018,
Nakagawa H, Ohuchi M
IEEE Trans Magn 54 (11): 5000405
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2018,
Munhoz-Rojas PE, Segura-Salas CS, Costa AA, Martins R, Hoffmann-Neto J
2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (EMC/APEMC), Suntec City, Singapore. IEEE: 1267-1273; ISBN 978-1-5090-3955-5
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2018,
Sun W, He Y, Diao Y, Leung SW, Siu YM, Kong YC
2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (EMC/APEMC), Suntec City, Singapore. IEEE: 872-874; ISBN 978-1-5090-3955-5
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2018,
He Y, Sun W, Leung PSW, Siu TYM, Ng KT
2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (EMC/APEMC), Suntec City, Singapore. IEEE: 936-939; ISBN 978-1-5090-3955-5
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2018,
Koh WJ, Moochhala SM
2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (EMC/APEMC), Suntec City, Singapore. IEEE: 518-522; ISBN 978-1-5090-3955-5
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2018,
Liu X, Mei B, Wang X, Wen Z
IEEE J Electromagn RF Microw Med Biol 2 (3): 186 - 192
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2018,
Sosnina E, Masleeva O, Bedretdinov R, Kryukov E
2018 18th International Conference on Harmonics and Quality of Power (ICHQP), Ljubljana, Slovenia. IEEE; ISBN 978-1-5386-0518-9
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2018,
He W, Xu B, He S, Ying Z
2018 International Workshop on Antenna Technology (iWAT), Nanjing, China. IEEE: 1-3; ISBN 978-1-5386-1852-3
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IEEE Antennas Wirel Propag Lett 17 (7): 1252 - 1256
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2018,
Modi KS, Singh SP, Tiwari U, Sinha RK
2018 3rd International Conference on Microwave and Photonics (ICMAP), Dhanbad. IEEE: 18; ISBN 978-1-5386-0934-7
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2018,
Gupta A, Verma S, Mani KV, Keshri GK, Karmakar S, Yadav A, Sharma M
2018 3rd International Conference on Microwave and Photonics (ICMAP), Dhanbad. IEEE: 18; ISBN 978-1-5386-0934-7
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2018,
Mobashsher AT, Abbosh A
2018 Australian Microwave Symposium (AMS), Brisbane, QLD, Australia. IEEE: 75-76; ISBN 978-1-5386-2569-9