キーワード:
"Elektromagnetisches Feld", EMF, "electromagnetic field", 電磁界
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2020,
Cassani R, Novak GS, Falk TH, Oliveira AA
J Neuroeng Rehabil 17: 147
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2020,
Zhao X, Liu Q, Dong G, Sun Y, Zhou H, Wang C
IEEE Microw Wirel Compon Lett 30 (12): 1205-1208
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2020,
Mohammad M, Pries JL, Onar OC, Galigekere VP, Su GL
2020 IEEE Energy Conversion Congress and Exposition (ECCE), Detroit, MI, USA. IEEE: 842-849; ISBN 978-1-7281-5827-3
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2020,
Zhang B, Carlson RB, Galigekere VP, Onar OC, Pries JL
2020 IEEE Energy Conversion Congress and Exposition (ECCE), Detroit, MI, USA. IEEE: 5185-5192; ISBN 978-1-7281-5827-3
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2020,
Vincenzi F, Pasquini S, Setti S, Salati S, Cadossi R, Borea PA, Varani K
Int J Mol Sci 21 (21): E8053
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2020,
Genovesi S, Butterworth IR, Cruz Serrallés JE, Daniel L
IEEE Access 8: 197745-197756
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2020,
Asadi R, Aliakbarian H, Khayambashi G, Majdolashrafi P
IEEE Electromagn Compat Mag 9 (3): 45-54
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2020,
Dinarević EC, Poljak D, Blažević Z
2020 International Conference on Software, Telecommunications and Computer Networks (SoftCOM), Split, Hvar, Croatia. IEEE: 1-4; ISBN 978-1-7281-7538-6
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2020,
Sharma A, Shrivastava S, Shukla S
Neurol India 68 (5): 1092-1100
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International Electrotechnical Commission (IEC), Institute of Electrical and Electronics Engineers (IEEE),
IEC/IEEE 62209-1528:2020: 1-284, ISBN 978-2-8-3228533-6
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2020,
Kwan KR, Kolansky Z, Abittan BJ, Farberg AS, Goldenberg G
Cutis 106 (3): 134-137;139;E1
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2020,
Judakova Z, Janousek L
2020 IEEE 21st International Conference on Computational Problems of Electrical Engineering (CPEE), Pińczów, Poland. IEEE: 1-4; ISBN 978-1-7281-9618-3
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2020,
Psenakova Z, Benova M, Mydlova J
[鉄道乗客の電磁界ばく露]
[tech./dosim.]
2020 IEEE 21st International Conference on Computational Problems of Electrical Engineering (CPEE), Pińczów, Poland. IEEE: 1-4; ISBN 978-1-7281-9618-3
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2020,
Mahfouz AM, Haraz OM, Ibraheem AAY
2020 37th National Radio Science Conference (NRSC), Cairo, Egypt. IEEE: 264-268; ISBN 978-1-7281-6820-3
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2020,
Psenakova Z, Gombárska D, Smetana M
2020 IEEE 21st International Conference on Computational Problems of Electrical Engineering (CPEE), Pińczów, Poland. IEEE: 1-4; ISBN 978-1-7281-9618-3
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2020,
Ramirez-Vazquez R, Escobar I, Thielens A, Arribas E
IEEE Access 8: 195692-195702
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2020,
Xia M, Zheng J, Chen J
2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI), Reno, NV, USA. IEEE: 257-260; ISBN 978-1-7281-7431-0
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2020,
Li K, Sasaki K, Wake K, Onishi T, Watanabe S
2020 XXXIIIrd General Assembly and Scientific Symposium of the International Union of Radio Science, Rome, Italy. IEEE: 1-4; ISBN 978-1-7281-5690-3
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2020,
Tognola G, Masini B, Gallucci S, Bonato M, Fiocchi S, Chiaramello E, Dossi L, Parazzini M, Ravazzani P
2020 XXXIIIrd General Assembly and Scientific Symposium of the International Union of Radio Science, Rome, Italy. IEEE: 1-4; ISBN 978-1-7281-5690-3
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2020,
Fetouri B, Ouberehil A, De Doncker P, Wiart J
2020 XXXIIIrd General Assembly and Scientific Symposium of the International Union of Radio Science, Rome, Italy. IEEE: 1-3; ISBN 978-1-7281-5690-3
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2020,
Franci D, Coltellacci S, Grillo E, Pavoncello S, Aureli T, Cintoli R, Migliore MD
2020 XXXIIIrd General Assembly and Scientific Symposium of the International Union of Radio Science, Rome, Italy. IEEE: 1-4; ISBN 978-1-7281-5690-3
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2020,
Chiaramello E, Tognola G, Bonato M, Gallucci S, Magne I, Souques M, Fiocchi S, Parazzini M, Ravazzani P
2020 XXXIIIrd General Assembly and Scientific Symposium of the International Union of Radio Science, Rome, Italy. IEEE: 1-4; ISBN 978-1-7281-5690-3
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2020,
Al Hajj M, Wang S, De Doncker P, Oestges C, Wiart J
2020 XXXIIIrd General Assembly and Scientific Symposium of the International Union of Radio Science, Rome, Italy. IEEE: 1-3; ISBN 978-1-7281-5690-3
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2020 XXXIIIrd General Assembly and Scientific Symposium of the International Union of Radio Science, Rome, Italy. IEEE: 1-3; ISBN 978-1-7281-5690-3
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2020,
Wang Q, Du X, Bauer T, Baerhold M, Plettemeier D
2020 XXXIIIrd General Assembly and Scientific Symposium of the International Union of Radio Science, Rome, Italy. IEEE: 1-4; ISBN 978-1-7281-5690-3