Challenges and Opportunities from the Out-of-Band Sensitivity of Data Loggers in a (Quasi)Autonomous Evaluation of Electromagnetic Exposure
tech./dosim.
By:
Gryz K, Karpowicz J, Zradziński P
Published in: 2024 IEEE International Symposium on Measurements & Networking (M&N), Rome, Italy. IEEE, 2024: pp. 1-6; ISBN 9798350370546
