Electromagnetic Compatibility Analysis Using Embedded Domain Decomposition Method
tech./dosim.
著者:
Lu J, Lee JF
掲載誌: 2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (EMC, SI & PI), Long Beach, CA, USA. IEEE, 2018: pp. 187-192; ISBN 978-1-5386-6622-7