Semi-empirical Model of Global Exposure using Stochastic Geometry
tech./dosim.
By:
Gontier Q, Petrillo L, Rottenberg F, Horlin F, Wiart J, Oestges C, De Doncker P
Published in: 2021 IEEE International Conference on Communications Workshops (ICC Workshops), Montreal, QC, Canada. IEEE, 2021: pp. 1-5; ISBN 978-1-7281-9442-4
