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37件の論文が見つかりました。

キーワード: Transposition, 転位

• 2024, Goto K, Kojima T, Oshima T, Saito A, Shimizu Y, Soma K, Nakayama Y, Hasumi E, Inuzuka R, Ando M, Amiya E, Fujiu K, Hirata Y, Hatano M, Ono M, Komuro I
  A leadless pacemaker implantation for a patient with systemic right ventricle under ventricular assist device support [dev./impl.]
  J Cardiol Cases 29 (6): 244-247
• 2023, Ilieş AI
  [電磁障害に対する三相高圧架空電力線の特性のインパクト] [tech./dosim.]
  2023 10th International Conference on Modern Power Systems (MPS), Cluj-Napoca, Romania. IEEE: pp. 01-05; ISBN 9798350326833
• 2022, Bulatov Y, Kryukov A, Suslov K
  [高圧長距離送電線のモードの統合モデリング] [tech./dosim.]
  2022 9th International Conference on Electrical and Electronics Engineering (ICEEE), Alanya, Turkey. IEEE: pp. 45-49; ISBN 978-1-6654-6755-1
• 2022, Gourzoulidis GA, Karabetsos E, Bourousis C, Tyrakis C, Flouris AD, Maris TG, Topalis FV
  [人工的な光放射の職業上の電磁スペクトルハザードとその有意性：ギリシャからの国別報告] [tech./dosim.]
  Med Lav 113 (2): e2022016
• 2021, Adamyan RT, Gileva KS, Aleshina ON, Sinelnikov ME
  [高圧電撃傷後の欠損および変形を伴う患者の外科的治療への最新の統合アプローチ] [foreign-language]
  Pirogov Russian Journal of Surgery (Khirurgiya. Zurnal im. N.I. Pirogova) (4): 5-14
• 2019, Said-Salman IH, Jebaii FA, Yusef HH, Moustafa ME
  [2.4 GHzのWi-Fi放射へのばく露後の大腸菌［Escherichia coli］K-12 DH5αの全般的遺伝子発現解析] [med./bio.]
  Sci Rep 9: 14425
• 2018, Morega M, Baran IM, Morega AM, Hussain AKL
  On the Assessment of Human Exposure to Low Frequency Magnetic Field at the Workplace [basics]
  Rev Roum Sci Techn – Électrotechn et Énerg 63 (2): 162-171
• 2018, Harimurugan D, Punekar GS
  Electric Field Reduction in an EHV Substation for Occupational Exposure via Transposition of Conductors [tech./dosim.]
  IEEE Transactions on Power Delivery 33 (6): 3147-3154
• 2017, Kumawat D, Ramananda K, Sahay P, Kumar A
  [電撃傷後の水晶体の後嚢破裂および自発的な後方転位] [elec. inj.]
  BMJ Case Rep 2017: bcr-2017-222765
• 2017, Bisceglia B, Valbonesi S, Carciofi C
  [指令2013/35/EU：批判的分析] [comment]
  2017 International Applied Computational Electromagnetics Society Symposium (ACES), Suzhou, China. IEEE; ISBN 978-0-9960078-3-2