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[詳細]
[口の電撃傷:答えを探し当てるまで]
[elec. inj.]
Burns 22 (2): 137-140
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1996,
Haberal M, Ucar N, Bayraktar U, Oner Z, Bilgin N
Burns 22 (2): 158-161
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1996,
Smith GR, Yang SS, Weiland AJ
Am J Orthop 25 (7): 502-506
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[詳細]
[小児の口腔と顔面部の負傷]
[review]
J Calif Dent Assoc 24 (3): 37-42
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1996,
Caneira E, Serafim Z, Duarte R, Leal MJ
Acta Med Port 9 (10-12): 325-330
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1996,
Lee RC, Astumian RD
Burns 22 (7): 509-519
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1996,
Al-Qattan MM, Gillet D, Thomson HG
Burns 22 (7): 555-556
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1996,
Ratnayake B, Emmanuel ER, Walker CC
[詳細]
[高電圧電撃傷後の神経学的後遺症]
[elec. inj.]
Burns 22 (7): 574-577
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1996,
Dubien PY, Bertin-Maghit M, Gueugniaud PY, Bouchard C, Ould-Aoudia T, Petit P
Presse Med 25 (36): 1781-1785
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1996,
Chi L, Ning YD, Jun QF, Zhong C, Hua SY
[詳細]
[グラファイト製の釣竿からの電撃傷]
[elec. inj.]
Burns 22 (8): 638-640
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1996,
Wanner-Olsen H, Nielsen PF, Petersen CT, Christensen JH
Ugeskr Laeger 158 (50): 7210-7212
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1996,
Wanner-Olsen H, Nielsen PF, Petersen CT, Christensen JH
Ugeskr Laeger 158 (50): 7246-7247
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1996,
Directorate-General for Employment, Industrial Relations and Social Affairs
European Commission,
Public Health and Safety at Work: 1-163, ISBN 978-92-827-5492-4
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1996,
Graber J, Ummenhofer W, Herion H
J Trauma 40 (2): 288-290
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1996,
Linder-Aronson A, Forsberg CM, Rygh P, Lindskog S
Eur J Orthod 18 (6): 581-588
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J Accid Emerg Med 13 (1): 68
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1996,
Paperman D, David Y, Martinez M
J Clin Eng 21 (3): 207-211
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1996,
Stevens A, Fischer A, Bartels M, Buchkremer G
Eur Psychiatry 11 (4): 165-174
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1996,
Zhao M, Agius-Fernandez A, Forrester JV, McCaig CD
J Cell Sci 109 (6): 1405-1414
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1996,
Takeshige C, Sato M
Acupunct Electrother Res 21 (2): 119-131
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1996,
de Wildt MJ, Debruyne FM, de la Rosette JJ
Urology 48 (3): 416-423
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1996,
Colombo R, Da Pozzo LF, Lev A, Freschi M, Gallus G, Rigatti P
J Urol 155 (4): 1227-1232
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1996,
Pasche B, Erman M, Hayduk R, Mitler MM, Reite M, Higgs L, Kuster N, Rossel C, Dafni U, Amato D, Barbault A, Lebet JP
Sleep 19 (4): 327-336
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1996,
Ellenbogen KA, Wood MA, Stambler BS
Pacing Clin Electrophysiol 19 (9): 1287-1295
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1996,
Dotsinsky IA, Daskalov IK
Med Biol Eng Comput 34 (6): 489-494