EMF-Portal | 文献検索結果

2014, Sacco B, Scotti A, Confalonieri C

ELF Envelope-Modulation Content in Broadcasting and Telecom RF Signals [temp.]

2014 International Symposium on Electromagnetic Compatibility, Tokyo, Japan. IEEE: pp. 1-6; ISBN 978-4-88552-287-1

2014, Ionut N

Magnetic fields generated by power systems. Some representative case studies [tech./dosim.]

2014 International Conference and Exposition on Electrical and Power Engineering (EPE), Iasi, Romania. IEEE: pp. 561-564; ISBN 978-1-4799-5849-8

2014, Pachuau L, Sailo L, Pachuau Z, Lalngneia PC

RF radiation from mobile phone towers and their effects on human body [epidem.]

Indian Journal of Radio & Space Physics 43 (2): 186-189

2014, Rauschenberg J, Nagel AM, Ladd SC, Theysohn JM, Ladd ME, Möller HE, Trampel R, Turner R, Pohmann R, Scheffler K, Brechmann A, Stadler J, Felder J, Shah NJ, Semmler W

Multicenter study of subjective acceptance during magnetic resonance imaging at 7 and 9.4 T [epidem.]

Invest Radiol 49 (5): 249-259

2014, Azhar NLA, Ariffin R, Abdullah H, Omar M

A pregnant women vest and window curtain as an RF electromagnetic shielding [tech./dosim.]

2014 IEEE Symposium on Industrial Electronics & Applications (ISIEA), Kota Kinabalu, Malaysia. IEEE; ISBN 978-1-4799-5591-6

2014, Ghavami Y, Mobayen MR, Vaghardoost R

[詳細] [電撃傷：患者682人の5年間調査] [elec. inj.]

Trauma Mon 19 (4): e18748-

2014, Bakir B, Babayigit MA, Tekbas OF, Ogur R, Kilic A, Ulus S

[小学校において健康影響の可能性のある物理的ハザードの評価] [tech./dosim.]

Turk Pediatri Ars 49 (3): 217-223

2014, Chou IJ, Tench CR, Gowland P, Jaspan T, Dineen RA, Evangelou N, Abdel-Fahim R, Whitehouse WP, Constantinescu CS

[3 T MRI検査を受けた小児の主観的不快感および小児の7 T装置忍容性に関する本装置を体験した成人の見方：質問票による横断調査] [epidem.]

BMJ Open 4 (10): e006094

2014, Philip NS, Carpenter SL, Carpenter LL

[詳細] [植え込み型迷走神経刺激装置を装着している患者における反復経頭蓋磁気刺激の安全な使用] [review]

Brain Stimul 7 (4): 608-612

2014, Ba Hakim AS, Abd Rahman NB, Mokhtar MZ, Said IB, Hussain H

[詳細] [マレーシアのクランバレーにおける架空送電線からの距離と急性小児白血病に関するELF-EMF相関研究] [epidem.]

2014 IEEE Conference on Biomedical Engineering and Sciences (IECBES), Kuala Lumpur, Malaysia. IEEE: pp. 710-714; ISBN 978-1-4799-4084-4