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2018,
Sweeney DC, Davalos RV
2018 40th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Honolulu, HI, USA. IEEE: pp. 5850-5853; ISBN 978-1-5386-3647-3
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2018,
Boyer A, Duffau H, Vincent M, Ramdani S, Mandonnet E, Guiraud D, Bonnetblanc F
2018 40th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Honolulu, HI, USA. IEEE: pp. 2210-2213; ISBN 978-1-5386-3647-3
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2018,
Kozlov M, Horner M, Kainz W, Angelone LM
2018 40th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Honolulu, HI, USA. IEEE: pp. 1360-1363; ISBN 978-1-5386-3647-3
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2018,
Tarnaud T, Tanghe E, Haesler S, Lopez CM, Martens L, Joseph W
2018 40th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Honolulu, HI, USA. IEEE: pp. 2166-2169; ISBN 978-1-5386-3647-3
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2018,
Shah AA, Alonso F, Vogel D, Wardell K, Coste J, Lemaire JJ, Pison D, Hemm S
2018 40th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Honolulu, HI, USA. IEEE: pp. 2222-2225; ISBN 978-1-5386-3647-3
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2018,
Al-Kaysi AM, Al-Ani A, Galvez V, Colleen Loo K, Ling S, Tjeerd Boonstra W
2018 40th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Honolulu, HI, USA. IEEE: pp. 3677-3680; ISBN 978-1-5386-3647-3
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2018,
Im C, Seo H, Jun SC
2018 40th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Honolulu, HI, USA. IEEE: pp. 3092-3095; ISBN 978-1-5386-3647-3
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2018,
Patwardhan R, Sonawane S, Harsh R, Gaikwad S
2018 International Conference On Advances in Communication and Computing Technology (ICACCT), Sangamner. IEEE: pp. 616-618; ISBN 978-1-5386-0927-9
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2018,
Paolini G, Masotti D, Costanzo A
2018 EMF-Med 1st World Conference on Biomedical Applications of Electromagnetic Fields (EMF-Med), Split, Croatia. IEEE: pp. 1-2; ISBN 978-1-5386-5922-9
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2018,
Knyazeva IR, Medvedev MA, Kutenkov OP, Vasilev AV, Gorokhovsky AA, Rostov VV
2018 20th International Symposium on High-Current Electronics (ISHCE), Tomsk, Russia. IEEE: pp. 94-97; ISBN 978-1-5386-6892-4