2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium, Raleigh, NC, USA. IEEE: pp. 381-385; ISBN 978-1-6654-4889-5
2021,
Beynel L, Dannhauer M, Palmer H, Hilbig SA, Crowell CA, Wang JE, Michael AM, Wood EA, Luber B, Lisanby SH, Peterchev AV, Cabeza R, Davis SW, Appelbaum LG