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キーワード: Mensch, humans

• 1999, Institute of Electrical and Electronics Engineers (IEEE) - Engineering in Medicine and Biology Society (EMBS) Committee on Man and Radiation (COMAR)
  [詳細] [RFシーラと誘電加熱装置からの電界・磁界へのヒトばく露-COMARの技術情報] [guideline]
  IEEE Eng Med Biol Mag 18 (1): 88-90
• 1999, Sandyk R
  [交流パルス電磁界を利用した治療により多発性硬化症の奥行き知覚機能障害が改善] [med. app.]
  Int J Neurosci 98 (1-2): 83-94
• 1999, Sandyk R
  [交流パルス電磁界が誘発するパーキンソン患者の性的興奮および陰茎勃起] [med. app.]
  Int J Neurosci 99 (1-4): 139-149
• 1999, Heroux P
  [極低周波健康影響オリンピック] [comment]
  Ann Occup Hyg 43 (4): 217-219
• 1999, Graham Jr JM, Jones KL, Brent RL
  [環境因子によって引き起こされる奇形の原因評価に対する臨床奇形学者および遺伝学者の役割：電離放射線、電磁界、マイクロ波、放射性核種、超音波] [basics]
  Teratology 59 (4): 307-313
• 1998, Wang J, Fujiwara O
  FDTD Computation of Temperature-Rise in the Human Head for Portable Telephones at 900 MHz [tech./dosim.]
  Fourteenth International Wrocław Symposium and Exhibition, Electromagnetic Compatibility 1998, Wroclaw, Poland. IEEE: pp. 342-345
• 1998, Probol C, Gonschorek KH
  Development of Field Probes Printed on Substrates for Dosimetric Assessments in the Frequency Range from 1 MHz to 18 GHz [tech./dosim.]
  Fourteenth International Wrocław Symposium and Exhibition, Electromagnetic Compatibility 1998, Wroclaw, Poland. IEEE: pp. 224-228
• 1998, Seker SS, Utku C, Cerezci O
  Power Absorbtion in a Multilayered Finite Length Cylindrical Model of Man Exposed by a Plane Wave at Oblique Incidence [tech./dosim.]
  Fourteenth International Wrocław Symposium and Exhibition, Electromagnetic Compatibility 1998, Wroclaw, Poland. IEEE: pp. 106-110
• 1998, Lee JB, Hea CS, Myung SH
  Calculation of Current Distribution in the Human Body around 765 kV Transmission Lines of Korea [tech./dosim.]
  EMC'98 ROMA International Symposium on Electromagnetic Compatibility, Rome, Italy. IEEE: pp. 145-149; ISBN 9798331500016
• 1998, Capasso A, Celozzi S, Lamedica R
  Prediction of the Electromagnetic Pollution Due to AC Railway Systems. Influence of Traction Load Variability [tech./dosim.]
  EMC'98 ROMA International Symposium on Electromagnetic Compatibility, Rome, Italy. IEEE: pp. 40-45; ISBN 9798331500016