-
2003,
Doebbelin R, Czarnecki TK, Mecke H, Winkler T
15th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 583-588; ISBN 978-1-5090-3197-9
-
2003,
Kramer A, Nikoloski N, Kuster N
15th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 305-306; ISBN 978-1-5090-3197-9
-
2003,
Loader BG, Alexander MJ, Liang W, Torihata S
15th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 57-60; ISBN 978-1-5090-3197-9
-
2003,
Lehmann H, Urech M, Pickl C
15th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 301-304; ISBN 978-1-5090-3197-9
-
2003,
Coray R, Krähenbühl P
15th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 149-154; ISBN 978-1-5090-3197-9
-
2003,
Neubauer G, Haider H, Lamedschwandner K, Riederer M, Coray R
15th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 143-148; ISBN 978-1-5090-3197-9
-
2003,
Bottauscio O, Crotti G, Farina G, Manzin A, Canova A, Tartaglia M
15th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 407-412; ISBN 978-1-5090-3197-9
-
2003,
Olivier C, Martens L
15th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 167-170; ISBN 978-1-5090-3197-9
-
2003,
Dobson J, Cranfield CG, Al Maddan J, Wieser HG
15th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 293-296; ISBN 978-1-5090-3197-9
-
2003,
Achermann P, Huber R, Schuderer J, Kuster N, Borbély AA
15th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 289-292; ISBN 978-1-5090-3197-9