キーワード:
電磁界, "Elektromagnetisches Feld", EMF, "electromagnetic field"
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2024,
Competence Centre Electromagnetic Fields (KEMF)
Federal Office for Radiation Protection (BfS) (ed.),
Spotlight, Dec/2024 no.3: 1-5
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2024,
Competence Centre Electromagnetic Fields (KEMF)
Federal Office for Radiation Protection (BfS) (ed.),
Spotlight, Dec/2024 no.4: 1-4
-
2024,
Competence Centre Electromagnetic Fields (KEMF)
Federal Office for Radiation Protection (BfS) (ed.),
Spotlight, Dec/2024 no.2: 1-5
-
2024,
Competence Centre Electromagnetic Fields (KEMF)
Federal Office for Radiation Protection (BfS) (ed.),
Spotlight, Dec/2024 no.1: 1-5
-
2024,
Competence Centre Electromagnetic Fields (KEMF)
Federal Office for Radiation Protection (BfS) (ed.),
Spotlight, Nov/2024 no.1: 1-5
-
2024,
Competence Centre Electromagnetic Fields (KEMF)
Federal Office for Radiation Protection (BfS) (ed.),
Spotlight, Oct/2024 no.1: 1-7
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2024,
Sachno D, Dahlmann F, Carstensen S, Wagner A, Schaudien D, Rittinghausen S, Müller M, Sewald K, Tillmann T, Kellner R, Bahr A, Wleklinski M, Bitsch A
Federal Office for Radiation Protection (BfS),
Ressortforschungsberichte zum Strahlenschutz, BfS-RESFOR-230/24: 1-85
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2024,
Meyer V, Gronau AI, Drees K, Jyoti J, Cakir E, Hütt MT, Lerchl A
Federal Office for Radiation Protection (BfS),
Ressortforschungsberichte zum Strahlenschutz, BfS‐RESFOR‐231/24: 1-39
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2024,
PricewaterhouseCoopers GmbH (PcW), German Research Center for Artificial Intelligence GmbH (AI)
Federal Office for Radiation Protection (BfS),
Ressortforschungsberichte zum Strahlenschutz, BfS‐RESFOR‐237/24: 1-74
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2024,
Lee J, Lee S, Byun I, Lee MC, Kim J, Seonwoo H
IEEE Open J Nanotechnol 5: 124-133