-
2005,
Roux D, Vian A, Goupil P, Ledoigt G, Girard S, Paladian F, Bonnet P
16th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 141-144; ISBN 978-1-5090-3198-6
-
16th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 145-150; ISBN 978-1-5090-3198-6
-
16th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 5-8; ISBN 978-1-5090-3198-6
-
2005,
Anzaldi G, Delgado EC, Riu PJ, Silva F
16th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 155-160; ISBN 978-1-5090-3198-6
-
16th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 1-4; ISBN 978-1-5090-3198-6
-
2005,
Bitz A, El Ouardi A, Streckert J, Hansen V
16th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 115-118; ISBN 978-1-5090-3198-6
-
2005,
Meyer FJC, van Wyk MJ, Kellerman RA
16th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 111-114; ISBN 978-1-5090-3198-6
-
16th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 123-126; ISBN 978-1-5090-3198-6
-
2005,
Nyenhuis JA, Amjad A, Kamondetdacha R, Park SM
16th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 13-16; ISBN 978-1-5090-3198-6
-
2005,
Francavilla M, Schiavoni A
16th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 107-110; ISBN 978-1-5090-3198-6