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1001件の論文が見つかりました。

キーワード: 電磁両立性, "elektromagnetische Verträglichkeit", EMC, EMV, "electromagnetic compatibility"

• 1998, Dimchev V, Handjiski B, Gavrovski C, Grcev L
  Comparison of Electromagnetic Fields Produced from Overhead Power Transmission Lines to Distribution Lines [tech./dosim.]
  EMC'98 ROMA International Symposium on Electromagnetic Compatibility, Rome, Italy. IEEE: pp. 133-138; ISBN 9798331500016
• 1998, Lisi A, Giuliani L, Vignati M, Graziani R, Santoro N, Pozzi D, Rieti S, Pasquali E, Ravagnan G, Grimaldi S
  Changes in Plasma Membrane Organization Induced by Exposure to ELF and to Amplitude Modulated Radiofrequencies [med./bio.]
  EMC'98 ROMA International Symposium on Electromagnetic Compatibility, Rome, Italy. IEEE: pp. 156-158; ISBN 9798331500016
• 1998, Hietanen M, Hämäläinen AM
  Exposure to Cellular Phones and EEG Activity [med./bio.]
  EMC'98 ROMA International Symposium on Electromagnetic Compatibility, Rome, Italy. IEEE: pp. 181-183; ISBN 9798331500016
• 1998, Batz L, Irnich W
  [DIN 570107 A1基準に基づく磁気干渉測定への提言] [tech./dosim.]
  Biomed Tech 43: 218-219
• 1998, Schlegel RE, Grant FH, Raman S, Reynolds D
  [心臓ペースメーカと携帯電話のin-vitro相互作用のEMC研究] [dev./impl.]
  Biomed Instrum Technol 32 (6): 645-655
• 1997, Watson DB, Sedcole NP, Chan E, Smart KG, Patel SM
  [電界中での昆虫の動き] [med./bio.]
  IET 10th International Conference on (Conf. Publ. No. 445) Electromagnetic Compatibility, 1997. IET: pp. 54-58
• 1997, Brinkmann K, Friedrich G
  [生物学的システムの電磁両立性 第5部：移動体無線電話システムおよび警察無からの高周波電磁界の生物影響] [basics]
  VDE-Verlag; ISBN 978-3-8007-2294-5
• 1997, Lazzi G, Gandhi OP
  [現実的に傾斜および切断された解剖学に基づくヒトの頭部のモデルを用いた携帯電話のドシメトリ] [tech./dosim.]
  IEEE Trans Electromagn Compat 39 (1): 55-61
• 1997, Bernardi P, Cavagnaro M, Pisa S
  [部分的閉鎖環境で使用された携帯電話についての人体頭部SAR分布の評価] [tech./dosim.]
  IEEE Trans Electromagn Compat 38 (3): 357-366
• 1996, Kimura K, Arisawa J
  Effect of 450 mT Static Magnetic Field on the Infectious Activity of Herpes Simplex Virus to Vero Cells [med./bio.]
  EMC'96 ROMA International Symposium on Electromagnetic Compatibility, Rome, Italy. IEEE: pp. 523-526; ISBN 9798331500009