キーワード:
電磁両立性, "elektromagnetische Verträglichkeit", EMC, EMV, "electromagnetic compatibility"
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2003,
Doebbelin R, Czarnecki TK, Mecke H, Winkler T
15th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 583-588; ISBN 978-1-5090-3197-9
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2003,
Kramer A, Nikoloski N, Kuster N
15th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 305-306; ISBN 978-1-5090-3197-9
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2003,
Loader BG, Alexander MJ, Liang W, Torihata S
15th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 57-60; ISBN 978-1-5090-3197-9
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2003,
Lehmann H, Urech M, Pickl C
15th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 301-304; ISBN 978-1-5090-3197-9
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2003,
Coray R, Krähenbühl P
15th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 149-154; ISBN 978-1-5090-3197-9
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2003,
Neubauer G, Haider H, Lamedschwandner K, Riederer M, Coray R
15th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 143-148; ISBN 978-1-5090-3197-9
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2003,
Bottauscio O, Crotti G, Farina G, Manzin A, Canova A, Tartaglia M
15th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 407-412; ISBN 978-1-5090-3197-9
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2003,
Olivier C, Martens L
15th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 167-170; ISBN 978-1-5090-3197-9
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2003,
Dobson J, Cranfield CG, Al Maddan J, Wieser HG
15th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 293-296; ISBN 978-1-5090-3197-9
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2003,
Achermann P, Huber R, Schuderer J, Kuster N, Borbély AA
15th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 289-292; ISBN 978-1-5090-3197-9
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2003,
Ruddle AR, Topham DA, Ward DD
2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446), Boston, MA, USA. 2巻; IEEE: pp. 543-547; ISBN 978-0-7803-7835-3
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2003,
Poljak D, Tham CY, Gandhi O, Sarolic A
IEEE Trans Electromagn Compat 45 (1): 141-145
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2003,
Hirata A, Morita M, Shiozawa T
IEEE Trans Electromagn Compat 45 (1): 109-116
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2003,
Malaric K, Bartolic J
Turk J Elec Eng & Comp Sci 11 (2): 143-154
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Polit Zeitgesch 53 (B42): 35-46
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2003,
Joseph W, Martens L
IEEE Trans Electromagn Compat 45 (2): 339-349
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[時間領域電磁干渉計測装置]
[tech./dosim.]
IEEE Trans Electromagn Compat 45 (2): 330-338
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2003,
Matsumoto Y, Takeuchi M, Fujii K, Sugiura A, Yamanaka Y
IEEE Trans Electromagn Compat 45 (3): 561-566
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Arch Mal Coeur Vaiss 96 (Spec. III): 65-70
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[植込み式医療機器と電磁両立性]
[foreign-language]
Arch Mal Coeur Vaiss 96: 57-64
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2003,
Nadi M, Hedjiedj A, Joly L, Schmitt P, Dodinot B, Aliot E
Arch Mal Coeur Vaiss 96 (Spec. III): 22-29
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2002,
Bernardi P, Cicchetti R, Testa O
2002 EMC-Europe Sorrento, Sorrento, Italy. IEEE: pp. 1-5; ISBN 9798331500023
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2002,
Mori F, Sorrentino R, Strappini M, Tarricone L
2002 EMC-Europe Sorrento, Sorrento, Italy. IEEE: pp. 1-5; ISBN 9798331500023
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2002 EMC-Europe Sorrento, Sorrento, Italy. IEEE: pp. 751-756; ISBN 9798331500023
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2002,
Bit-Babik G, Faraone A
2002 EMC-Europe Sorrento, Sorrento, Italy. IEEE: pp. 1-6; ISBN 9798331500023