キーワード:
米国電気電子学会, "Institute of Electrical and Electronics Engineers", IEEE
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IEEE Eng Med Biol Mag 6 (1): 47-51
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1987,
Kullmann W, Dallas WJ
IEEE Trans Biomed Eng 34 (11): 837-842
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IEEE Eng Med Biol Mag 6 (1): 22-25
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1987,
Stuchly MA, Hansson Mild K
IEEE Eng Med Biol Mag 6: 15-17
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IEEE Eng Med Biol Mag 6: 18-21
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1986,
Atalay N, Aydin G, Pamuk F
Proceedings of the Eighth Annual Conference of the IEEE Engineering in Medicine and Biology Society, Fort Worth, TX, USA. 3巻; IEEE: pp. 1398-1400
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1986,
Larkin WD, Reilly JP, Kittler LB
IEEE Trans Biomed Eng 33 (5): 495-504
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1986,
Wang W, Gervais Y, Mukhedkar D
IEEE Transactions on Power Delivery 1 (1): 105-110
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1986,
Stuchly MA, Spiegel RJ, Stuchly SS, Kraszewski A
IEEE Trans Microw Theory Tech 34 (1): 26-31
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1986,
Guy AW, Chung-Kwang C
IEEE Trans Microw Theory Tech 34 (6): 671-680
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1986,
Tofani S, Anglesio G, Ossola P
IEEE Trans Microw Theory Tech 34 (7): 832-835
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1986,
Chen KM, Misra D, Wang H, Chuang HR, Postow E
IEEE Trans Biomed Eng 33 (7): 697-701
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IEEE Trans Microw Theory Tech 34 (2): 228-235
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1986,
Chatterjee I, Wu D, Gandhi OP
IEEE Trans Biomed Eng 33 (5): 486-494
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1986,
Gandhi OP, Chen JY, Riazi A
IEEE Trans Biomed Eng 33 (8): 757-767
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1986,
Smith SR, Foster KR, Wolf GL
IEEE Trans Biomed Eng 33 (5): 522-524
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1986,
Furia L, Hill DW, Gandhi OP
IEEE Trans Biomed Eng 33 (11): 993-999
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1986,
Chen KM, Chuang HR, Lin CJ
IEEE Trans Biomed Eng 33 (8): 746-756
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1985,
Hagmann MJ, Levin RL
IEEE Trans Microw Theory Tech 33 (7): 649-654
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1985,
Forster JD, Barnes FS, Wachtel H, Bowman RR, Frazer JW, Chalker R
IEEE Trans Microw Theory Tech 33 (8): 674-680
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1985 IEEE International Symposium on Electromagnetic Compatibility, Wakefield, MA, USA. IEEE: pp. 522-524; ISBN 978-1-5090-3172-6
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1985,
Stuchly MA, Kraszewski A, Stuchly SS
IEEE Trans Biomed Eng 32 (8): 609-616
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1985,
Reilly JP, Freeman VT, Larkin WD
IEEE Trans Biomed Eng 32 (12): 1001-1011
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[家庭用電気機器の磁界の調査]
[tech./dosim.]
IEEE Transactions on Power Apparatus and Systems PAS-104 (9): 2435-2444
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Electrical shock safety criteria: Proceedings of the first international symposium on electrical shock safety criteria. Pergamon Press: pp. 321-334; ISBN 978-0-08-025399-2