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509件の論文が見つかりました。

キーワード: 確率, Irrtumswahrscheinlichkeit, Wahrscheinlichkeit, probability

• 2018, Arabi AA, Matta CF
  [強い一様電界の影響力下でのアデニン－チミン互変異性化] [tech./dosim.]
  Phys Chem Chem Phys 20 (18): 12406-12412
• 2018, Fiocchi S, Chiaramello E, Parazzini M, Ravazzani P
  [確率論的ドシメトリを用いた50 Hzの超低周波磁界への胎児のばく露に対する組織の導電率の影響力] [tech./dosim.]
  PLoS One 13 (2): e0192131
• 2017, Jin L, Peng C, Jiang T
  System-Level Electric Field Exposure Assessment by the Fault Tree Analysis [tech./dosim.]
  IEEE Trans Electromagn Compat 59 (4): 1095-1102
• 2017
  [Procedure for the assessment of the exposure to electromagnetic fields of workers bearing active implantable medical devices – Part 2-1: Specific assessment for workers with cardiac pacemakers; German version EN 50527-2-1:2016] [guideline]
  German Commission for Electrical, Electronic & Information Technologies of DIN and VDE (DKE), DIN EN 50527-2-1 VDE 0848-527-2-1:2017-12
• 2017, Mat MH, Jusoh M, Rahim H, Yusoff MI
  A Brief Review of the EMF Interaction: Metal Implantation and Biological Tissues [basics]
  Adv Sci Lett 23 (6): 5565-5568
• 2017, Carrasco-López C, Soto-León V, Céspedes V, Profice P, Strange BA, Foffani G, Oliviero A
  Static Magnetic Field Stimulation over Parietal Cortex Enhances Somatosensory Detection in Humans [med. app.]
  J Neurosci 37 (14): 3840-3847
• 2017, Mina F, Modolo J, Recher F, Dieuset G, Biraben A, Benquet P, Wendling F
  [局所直流電流刺激による海馬解放のモデルガイドコントロール] [tech./dosim.]
  Sci Rep 7: 1708
• 2017, Chansakul T, Young GS
  [妊婦の神経画像撮影] [basics]
  Semin Neurol 37 (6): 712-723
• 2017, Sadashivaiah V, Sacre P, Guan Y, Anderson WS, Sarma SV
  [哺乳類の神経線維の電気的刺激のモデリング：機械論的vs.確率論的アプローチ] [tech./dosim.]
  2017 39th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Jeju, Korea (South). IEEE: pp. 3868-3871; ISBN 978-1-5090-2810-8
• 2017, Panescu D, Kroll MW, Brave MA
  [新型の導電性電気兵器：安全マージンの有限要素モデリング] [tech./dosim.]
  2017 39th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Jeju, Korea (South). IEEE: pp. 2170-2176; ISBN 978-1-5090-2810-8