キーワード:
確率, Irrtumswahrscheinlichkeit, Wahrscheinlichkeit, probability
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2020,
Bonato M, Chiaramello E, Fiocchi S, Gallucci S, Dossi L, Tognola G, Ravazzani P, Parazzini M
2020 IEEE 20th Mediterranean Electrotechnical Conference ( MELECON), Palermo, Italy. IEEE: pp. 429-433; ISBN 978-1-7281-5201-1
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2020,
Pfeiffer F, Benali A
Neural Regen Res 15 (11): 1977-1980
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2020,
Habelt B, Arvaneh M, Bernhardt N, Minev I
Bioelectron Med 6: 4
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2020,
Bonato M, Chiaramello E, Fiocchi S, Tognola G, Ravazzani P, Parazzini M
IEEE J Electromagn RF Microw Med Biol 4 (3): 179-186
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German Commission for Electrical, Electronic & Information Technologies of DIN and VDE (DKE),
DIN EN 50527-2-2 VDE 0848-527-2-2:2019-11
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2019,
Masrakin K, Rahim HA, Soh PJ, Abdulmalek M, Adam I, Warip MNBM, Abbasi QH, Yang X
IEEE Access 7: 98946-98958
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2019,
Masumnia-Bisheh K, Forooraghi K, Ghaffari-Miab M, Furse CM
IEEE Trans Antennas Propag 67 (12): 7466-7475
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2019,
Aroke O, Doherty M, Esmaeili B
2019 IEEE IAS Electrical Safety Workshop (ESW), Jacksonville, FL, USA. IEEE: pp. 1-7; ISBN 978-1-7281-0645-8
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2019,
Hurtado-Jimenez J, Leon-Grande AM, Cabello-Garcia JR, Lara-Raya FR
2019 6th International Advanced Research Workshop on Transformers (ARWtr), Cordoba, Spain. IEEE: pp. 99-104; ISBN 978-1-7281-0959-6
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2019,
Pavan A, Ghin F, Contillo A, Milesi C, Campana G, Mather G
Brain Stimul 12 (4): 967-977
