EMF-Portal | 文献検索結果

2018, Foster KR, Ziskin MC, Balzano Q, Hirata A

[1 GHz超の無線周波ばく露限度における平均化時間の熱的分析] [tech./dosim.]

IEEE Access 6: 74536 - 74546

2018, Watari T, Tokuda Y

[MRI熱傷：新規のハイテク下着を着用することの認識されていない結果] [misc.]

QJM 111 (7): 495-496

2018, Feldman DS

[皮膚のバイオマテリアル足場の再生能力の強化のための拍動性電磁界の利用の実施可能性] [med. app.]

J Funct Biomater 9 (4): e66

2018, Li K, Sasaki K, Watanabe S

EMF Exposure from 5G Equipment at Millimeter Wave Frequencies [tech./dosim.]

2018 IEEE International Workshop on Electromagnetics:Applications and Student Innovation Competition (iWEM), Nagoya, Japan. IEEE: p. 1; ISBN 978-1-5386-4835-3

2018, Asan AS, Gok S, Sahin M

[経皮及び頭蓋内電流注入によってラットの脳に誘導される電界] [med./bio.]

2018 40th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Honolulu, HI, USA. IEEE: pp. 2252-2255; ISBN 978-1-5386-3647-3

2018, Rezaee Z, Dutta A

[脚運動野の経頭蓋直流刺激‐体性感覚の一部か？] [med. app.]

2018 40th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Honolulu, HI, USA. IEEE: pp. 4764-4767; ISBN 978-1-5386-3647-3

2018, Paolini G, Masotti D, Costanzo A

[無線周波にばく露したケラチノサイト及び表皮に対する比吸収率及び熱変動の影響のシミュレーション] [tech./dosim.]

2018 EMF-Med 1st World Conference on Biomedical Applications of Electromagnetic Fields (EMF-Med), Split, Croatia. IEEE: pp. 1-2; ISBN 978-1-5386-5922-9

2018, Vilaaosh Z, Lajevardipour A, Wood A

[ヒトの耳に対する60-300 GHzの透過のシミュレーション] [tech./dosim.]

2018 43rd International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), Nagoya, Japan. 第第11版; IEEE: pp. 1-2; ISBN 978-1-5386-3810-1

2018, Yaekashiwa N, Otsuki S, Yoshida H, Hayashi S, Kawase K

[ヒト細胞に対するテラヘルツ波の非熱作用の検証] [med./bio.]

2018 43rd International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), Nagoya, Japan. 第第11版; IEEE: pp. 1-2; ISBN 978-1-5386-3810-1

2018, Cantu JC, Peralta XG, Cerna CZ, Echchzadda I

[サブミリ波ばく露によるエピジェネティックな改変] [med./bio.]

2018 43rd International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), Nagoya, Japan. 第第11版; IEEE: pp. 1-2; ISBN 978-1-5386-3810-1