15th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 289-292; ISBN 978-1-5090-3197-9
2003,
Thut G, Northoff G, Ives JR, Kamitani Y, Pfennig A, Kampmann F, Schomer DL, Pascual-Leone A