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437件の論文が見つかりました。

キーワード: ロング・ターム・エボリューション, "evolved UMTS Terrestrial Radio Access Network", "High Speed OFDM Packet Access", "Long Term Evolution", E-UTRAN, HSOPA, LTE, 高速OFDMパケットアクセス

• 2025, Rufo-Pérez M, Antolín-Salazar A, Paniagua-Sánchez JM, Jiménez-Barco A, Rodríguez-Hernández FJ
  Spatial and Temporal Mapping of RF Exposure in an Urban Core Using Exposimeter and GIS [tech./dosim.]
  Sensors 25 (5): 1301
• 2025, Al-Sadi N, Shehab M, Alzoughool M
  Assessment of exposure to RF-EMF among telecommunication tower workers in Kuwait [tech./dosim.]
  Discov Public Health 22 (1): 64
• 2025, Chung MA, Hsieh MC, Hsu CC, Lin CW
  A Compact Multi-Band MIMO Antenna with High Isolation and Low SAR for LTE and Sub-6 GHz Applications [tech./dosim.]
  IEEE Access [in press]
• 2025, Kheradiya V, Pandey GP, Desai A
  Metasurface integrated dual polarized all textile antenna for WBAN application [tech./dosim.]
  Phys Scr 100 (3): 035536
• 2025, Foster KR, Maxson D, Zollman PM
  Waveforms of 4G and 5G Radiofrequency Signals: Are Differences Relevant to Biology or Health? [basics]
  Health Phys 128 (4): 332-336
• 2025, Chung MA, Chen KX, Hsu CC, Lin CW
  [LTE、5G、Wi-Fi 7、Xバンド通信アプリケーション向け10×10マルチバンドMIMOアンテナシステム] [tech./dosim.]
  IEEE Access 13: 28693-28710
• 2025, Kumar D, Iyer S, Lopez OA
  [モバイルネットワークの進化] [basics]
  Iyer S, Kalla A, Lopez OA, De Alwis C (eds.): Intelligent Spectrum Management: Towards 6G. IEEE; pp. 1-25; ISBN 978-1-394-20122-8
• 2024, Arivarsi A, Kumar A, Misra A
  [5G電磁界、電磁障害測定、健康への影響、遮蔽材料に関する調査] [basics]
  2024 International Conference on Modeling, Simulation & Intelligent Computing (MoSICom), Dubai, United Arab Emirates. IEEE: pp. 57-62; ISBN 9798331533328
• 2024, Lee AK, Jeon S, Wang S, Wiart J, Choi HD, Moon JI
  [韓国の地域別人口密度とダウンリンク電磁界ばく露レベル] [tech./dosim.]
  2024 IEEE Asia-Pacific Microwave Conference (APMC), Bali, Indonesia. IEEE: pp. 781-783; ISBN 9798350363555
• 2024, Jeon S, Lee AK, Choi HD, Moon JI
  [4Gと5Gの電磁界への同時ばく露用の動物ばく露システムの設計] [tech./dosim.]
  2024 IEEE Asia-Pacific Microwave Conference (APMC), Bali, Indonesia. IEEE: pp. 321-323; ISBN 9798350363555