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Institute of Electrical and Electronics Engineers (IEEE),
IEEE Std C95.3-2002: 1-126, ISBN 978-0-7381-3520-5
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German Commission for Electrical, Electronic & Information Technologies of DIN and VDE (DKE),
DIN VDE 0848-3-1:2002-05;VDE 0848-3-1:2002-05 - Entwurf
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2002,
Kim MJ, Cho JH, Kim SY, Kim JH, Lee JH, Rhee SJ
Nutrition Research 22 (6): 733-744
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2002,
Yu G, Coln EA, Schoenbach KH, Gellermann M, Fox P, Rec L, Beebe SJ, Liu S
IEEE Trans Plasma Sci 30 (4): 1489-1496
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2002,
Hadjiloucas S, Chahal MS, Bowen JW
Phys Med Biol 47 (21): 3831-3839
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2002,
Hirata A, Watanabe H, Shiozawa T
IEEE Trans Electromagn Compat 44 (4): 592-594
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2002,
Shckorbatov YG, Shckorbatov VG, Navrotskaya VV, Grabina VA, Sirenko SP, Fisun AI, Gorobets NN, Kiyko VI
Electrophoresis 23 (13): 2074-2079
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2002,
Pooley DT, Gibson C, Stewart WR, Magee J, Ellison BN
Rev Sci Instrum 73 (4): 1296-1302
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2002,
Tafforeau M, Verdus MC, Norris V, White G, Demarty M, Thellier M, Ripoll C
Journal of Trace and Microprobe Techniques 20 (4): 611-623
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2002,
Vorobyov VV, Khramov RN
Am J Chin Med 30 (1): 29-35