EMF-Portal | 文献検索結果

2014, Shahbazi-Gahrouei D, Razavi S, Salimi M

[詳細] Effect of extremely low-frequency (50 Hz) field on proliferation rate of human adipose-derived mesenchymal stem cells [med./bio.]

J Radiobiol 1 (2): 31-37

2014, Mahmood B, Jaleh S, Yasaman Y

Study of DC and AC electric field effect on Pisum sativum seeds growth [med./bio.]

Eur Phys J AP 67 (1): 11201

2014, Mugunthan N, Anbalagan J, Meenachi S

[詳細] [マウス精巣に対する2G携帯電話放射 (900 - 1900 MHz) への長期ばく露の影響] [med./bio.]

Int J Sci Res 3 (9): 523-529

2014, Nakayama M, Hondou T, Miyata H

[詳細] [50Hz磁界にばく露した神経芽細胞におけるDNA鎖切断] [med./bio.]

Proceedings of the 12th Asia Pacific Physics Conference (APPC12), 2013. JPS: p. 012057; ISBN 978-4-89027-101-6

2014, Wocik-Piotrowicz K, Kaszuba-Zwoinska J, Rokita E, Thor P, Chrobik P, Nieckarz Z, Michalski J

[詳細] [U937細胞の生存力に対する静磁界および交流磁界の影響] [med./bio.]

Folia Med Cracov 54 (4): 21-33

2014, Liebl MP, Behl C, Clement AM

[実験モデルにおける神経変性疾患の発症および進行に対する低周波電磁界の影響：プロジェクト3608S03008] [info]

Federal Office for Radiation Protection (BfS), Ressortforschungsberichte zur kerntechnischen Sicherheit und zum Strahlenschutz, BfS-RESFOR-95/14: 1-74

2014, Wilson JW, Haines J, Sienkiewicz Z, Dubrova YE

[詳細] [マウスでの突然変異誘発に対する超低周波磁界の影響] [med./bio.]

Mutation Research - Fundamental and Molecular Mechanism of Mutagenesis 760: 22-26

2014, Chen F, Qi H, Ming D, Zhou P

[超低周波パルス磁界刺激により脳に誘導される影響の研究] [med. app.]

2014 36th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, Chicago, IL, USA. IEEE: pp. 2613-2616; ISBN 978-1-4244-7929-0

2014, Lv B, Su C, Yang L, Xie Y, Wu T

[詳細] [ロング·ターム·エボリューション電磁界ばく露による全脳の脳電図同期の尤度の変調] [med./bio.]

2014 36th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, Chicago, IL, USA. IEEE: pp. 986-989; ISBN 978-1-4244-7929-0

2014, Shiina T, Suzuki Y, Kasai Y, Inami Y, Taki M, Wake K

[PC12VG細胞の神経突起の伸長に対する偏波を考慮した60GHzミリ波への2回の24時間ばく露の影響] [med./bio.]

2014 International Symposium on Electromagnetic Compatibility, Tokyo, Tokyo, Japan. IEEE: pp. 166-169; ISBN 978-4-88552-287-1