キーワード:
"reference levels", "Abgeleitete Grenzwerte", Referenzwerte, 参考レベル
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2020,
Cruciani S, Campi T, Maradei F, Feliziani M
2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Rome, Italy. IEEE: 1-4; ISBN 978-1-7281-5580-7
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2020,
Kamimura Y, Daimon K, Matsumoto N, Kimura S, Sato K
2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Rome, Italy. IEEE: 1-4; ISBN 978-1-7281-5580-7
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2020,
Lämmle T, Parspour N, Mönch M
2020 5th International Conference on Smart and Sustainable Technologies (SpliTech), Split, Croatia. IEEE: 1-6; ISBN 978-1-7281-7363-4
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2020,
Asadi R, Aliakbarian H, Khayambashi G, Majdolashrafi P
IEEE Electromagn Compat Mag 9 (3): 45-54
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2020,
Ramirez-Vazquez R, Escobar I, Thielens A, Arribas E
IEEE Access 8: 195692-195702
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2020,
Soldati M, Murakami T, Laakso I
Phys Med Biol 65 (21): 215006
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Ann Work Expo Health 64 (8): 838-851
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2020,
Celaya-Echarri M, Azpilicueta L, Karpowicz J, Ramos V, Lopez-Iturri P, Falcone F
IEEE Access 8: 100930-100947
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2020,
Christ A, Samaras T, Neufeld E, Kuster N
Bioelectromagnetics 41 (5): 348-359
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2020,
de Goede AA, Cumplido-Mayoral I, van Putten MJAM
Brain Topogr 33 (4): 425-437