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2011,
Ikehata M, Yoshie S, Wada K, Suzuki Y, Sakai T, Wake K, Nakasono S, Taki M, Ohkubo C
2011 XXXth URSI General Assembly and Scientific Symposium, Istanbul. IEEE: p. 12340345; ISBN 978-1-4244-5117-3
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2011,
Ushiyama A, Unno A, Ohtani S, Suzuki Y, Wada K, Kunugita N, Ohkubo C
2011 XXXth URSI General Assembly and Scientific Symposium, Istanbul. IEEE: p. 12340374; ISBN 978-1-4244-5117-3
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2011,
Ogasawara Y, Ikehata M, Sakaguchi R, Awakura S, Yoshie S, Ohkubo C, Ishii K
2011 XXXth URSI General Assembly and Scientific Symposium, Istanbul. IEEE: p. 12340344; ISBN 978-1-4244-5117-3
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2011,
Yoshie S, Suzuki Y, Wada K, Wake K, Sakai T, Nakasono S, Taki M, Ohkubo C, Ikehata M
2011 XXXth URSI General Assembly and Scientific Symposium, Istanbul. IEEE: p. 12354188; ISBN 978-1-4244-5117-3
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2011,
Sakurai T, Kiyokawa T, Narita E, Miyakoshi J
2011 XXXth URSI General Assembly and Scientific Symposium, Istanbul. IEEE: p. 12354187; ISBN 978-1-4244-5117-3
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German Commission for Electrical, Electronic & Information Technologies of DIN and VDE (DKE),
DIN EN 50191 VDE 0104:2011-10
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2011,
Imoto AM, Peccin S, Almeida GJ, Saconato H, Atallah AN
Sao Paulo Med J 129 (6): 414-423
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International Organization for Standardization (ISO), International Electrotechnical Commission (IEC),
ISO/IEC TR 20017:2011: 1-56
-
German Social Accident Insurance (DGUV),
IFA-Report 5/2011: 1-72, ISBN 978-3-86423-011-0
-
Association for Electrical, Electronic & Information Technologies (VDE),
VDE-AR-E 2122-4-2:2011-03
