キーワード:
"electromagnetic field", "Elektromagnetisches Feld", EMF, 電磁界
-
2018,
Le Renard PE, Nimmervoll B, Fellner F, Oppelt P
2018 EMF-Med 1st World Conference on Biomedical Applications of Electromagnetic Fields (EMF-Med), Split, Croatia. IEEE: pp. 1-2; ISBN 978-1-5386-5922-9
-
2018,
Bachmann M, Lass J, Ioannides AA, Hinrikus H
2018 EMF-Med 1st World Conference on Biomedical Applications of Electromagnetic Fields (EMF-Med), Split, Croatia. IEEE: pp. 1-2; ISBN 978-1-5386-5922-9
-
2018,
Chen X, Liu HC, Gong HT, Wang HH, Zhang JH
2018 International Conference on Power System Technology (POWERCON), Guangzhou, China. IEEE: pp. 1-5; ISBN 978-1-5386-6462-9
-
2018,
Cui H, Zhong W, Li H, He F, Chen M, Xu D
2018 IEEE Applied Power Electronics Conference and Exposition (APEC), San Antonio, TX, USA. IEEE: pp. 1336-1343; ISBN 978-1-5386-1181-4
-
2018,
Caccami MC, Hogan MP, Alfredsson M, Marrocco G, Batchelor JC
IEEE Trans Antennas Propag 66 (2): 609-617
-
2018,
Pavel I, David V, Donose C
2018 International Conference and Exposition on Electrical And Power Engineering (EPE), Iasi, Romania. IEEE: pp. 0568-0571; ISBN 978-1-5386-5063-9
-
2018,
Ibrahim A, Meng M, Kiani M
IEEE Sens J 18 (9): 3813-3826
-
2018,
Koppel T, Vilcane I, Ahonen M
2018 EMF-Med 1st World Conference on Biomedical Applications of Electromagnetic Fields (EMF-Med), Split, Croatia. IEEE: pp. 1-2; ISBN 978-1-5386-5922-9
-
2018,
Yosef RA, Mobashsher AT, Abbosh A
2018 Australian Microwave Symposium (AMS), Brisbane, QLD, Australia. IEEE: pp. 91-92; ISBN 978-1-5386-2569-9
-
2018,
Abou Houran M, Yang X, Chen W
Energies 11 (12): 3488
-
2018,
Shuai CJ, Xie XC, Li RM, Wang XK
Acta Microsc 27 (3): 202-208
-
2018,
Paras DS, Gajanin BR, Manojlovic LM, Ruzic NZ
Acta Vet-Beogr 68 (4): 484-501
-
2018,
Salceanu A, Ursache S, Asiminicesei OM, Lazarescu C
2018 International Conference and Exposition on Electrical And Power Engineering (EPE), Iasi, Romania. IEEE: pp. 759-764; ISBN 978-1-5386-5063-9
-
2018 International Conference and Exposition on Electrical And Power Engineering (EPE), Iasi, Romania. IEEE: pp. 693-696; ISBN 978-1-5386-5063-9
-
2018,
Gonos J, Kladas A, Labridis D, Mikropoulos P, Koulouridis S, Pyrgioti E, Kyriacou G, Safigianni A
2018 IEEE International Conference on Environment and Electrical Engineering and 2018 IEEE Industrial and Commercial Power Systems Europe (EEEIC / I&CPS Europe), Palermo, Italy. IEEE: pp. 1-5; ISBN 978-1-5386-5187-2
-
2018,
Ma L, Zhang X, Ying BA, Wu L
Li Y, Gao L, Xu WL (eds.): 11th Textile Bioengineering and Informatics Symposium proceedings (TBIS 2018) : Manchester, United Kingdom, 25-28 July 2018. Curran Associates, Inc., Red Hook, NY; pp. 205-211; ISBN 978-1-5108-7035-2
-
2018,
Medveď D, Pavlík M, Zbojovský J
2018 International IEEE Conference and Workshop in Óbuda on Electrical and Power Engineering (CANDO-EPE), Budapest, Hungary. IEEE: pp. 000289-000294; ISBN 978-1-7281-1155-1
-
2018,
Silva AAR, Silva LB, Silva RM, Dias RBB
Arezes PM, Baptista JS, Barroso MP, Carneiro P, Cordeiro P, Costa N, Melo RB, Miguel AS, Perestrelo G (eds.): Occupational Safety and Hygiene VI: Book Chapters from the 6th International Symposium on Occupation Safety and Hygiene (SHO 2018), March 26-27, 2018, Guimarães, Portugal. CRC Press/Balkema, Leiden, The Netherlands; pp. 213-217; ISBN 978-1-138-54203-7
-
2018,
Liorni I, Neufeld E, Kuehn S, Kuster N
2018 IEEE Wireless Power Transfer Conference (WPTC), Montreal, QC, Canada. IEEE: pp. 1-3; ISBN 978-1-5386-5160-5
-
2018,
Jaworski M, Szuba M, Grycan W
2018 Progress in Applied Electrical Engineering (PAEE), Koscielisko, Poland. IEEE: pp. 1-6; ISBN 978-1-5386-6092-8
-
2018,
Calabrò E, Magazù S
Phys Lett A 382 (21): 1389-1394
-
2018,
Drandić A, Trkulja B
Engineering Analysis with Boundary Elements 91: 1-6
-
Balas VE, Jain LC, Balas MM (eds.): Soft Computing Applications. SOFA 2016. Advances in Intelligent Systems and Computing, 633巻; Springer, Cham; pp. 95-106; ISBN 978-3-319-62520-1
-
2018,
Lunca E, Ursache S, Salceanu A
Measurement 124: 197-204
-
2018,
Barabas J, Radil R, Janousek L, Kamencay P
2018 ELEKTRO, Mikulov, Czech Republic. IEEE: pp. 1-4; ISBN 978-1-5386-4760-8