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793件の論文が見つかりました。

キーワード: "electromagnetic compatibility", "elektromagnetische Verträglichkeit", EMC, EMV, 電磁両立性

• 1996, Grigoriev YG, Lukianova SN, Makarov VH, Rynskov VV
  The Total Bioelectrical Activity of Various Structures of Brain in Condition of Low- Level Microwave Irradiation [temp.]
  EMC'96 ROMA International Symposium on Electromagnetic Compatibility, Rome, Italy. IEEE: pp. 514-516; ISBN 9798331500009
• 1996, Kunsch B
  The European Pre-Standard ENV 50166 ”Human Exposure to Electromagnetic Fields” in Perspective [temp.]
  EMC'96 ROMA International Symposium on Electromagnetic Compatibility, Rome, Italy. IEEE: pp. 1-6; ISBN 9798331500009
• 1996, Henschel M, Zemann E
  Large Scale Measurements of Low Frequency Electromagnetic Fields in Berlin and Field Reducing Activities in Power Stations [temp.]
  EMC'96 ROMA International Symposium on Electromagnetic Compatibility, Rome, Italy. IEEE: pp. 840-845; ISBN 9798331500009
• 1996, Saito A, Kimura K, Misawa K, Arisawa J
  Effect of Static Magnetic Field on Bacterial Infection to HeLa Cells [temp.]
  EMC'96 ROMA International Symposium on Electromagnetic Compatibility, Rome, Italy. IEEE: pp. 527-531; ISBN 9798331500009
• 1996, Betz HD, Schandry R, Leopold C, Oettinger WP, Berg H, Kulzer R, Tritschler J
  Sensivity of Humans to Low-Frequency Magnetic Fields [temp.]
  EMC'96 ROMA International Symposium on Electromagnetic Compatibility, Rome, Italy. IEEE: pp. 517-522; ISBN 9798331500009
• 1996, Schiavoni A, Richiardi G, Bielli P
  SAR Evaluation for an Anatomically-Based Model of the Human Head Generated by Different Types of Cellular Phones [temp.]
  EMC'96 ROMA International Symposium on Electromagnetic Compatibility, Rome, Italy. IEEE: pp. 182-187; ISBN 9798331500009
• 1996, Nicolini P
  Checking Compliance of Occupational and Residential Exposure to 50 Hz Electric and Magnetic Fields with European Standards [temp.]
  EMC'96 ROMA International Symposium on Electromagnetic Compatibility, Rome, Italy. IEEE: pp. 7-12; ISBN 9798331500009
• 1996, Caorsi S, Gragnani GL, Massa A, Pastorino M, Raffetto M
  Human Exposure to Electromagnetic Fields Produced by Personal Mobile Telephones [temp.]
  EMC'96 ROMA International Symposium on Electromagnetic Compatibility, Rome, Italy. IEEE: pp. 188-193; ISBN 9798331500009
• 1996, Okoniewski M, Stuchly MA, Stuchly SS
  Feasibility of using FDTD to Model Fields from PCS in a Hospital Environment [temp.]
  EMC'96 ROMA International Symposium on Electromagnetic Compatibility, Rome, Italy. IEEE: pp. 200-203; ISBN 9798331500009
• 1996, Bernardi P, Cavagnaro M, Pisa S
  Evaluation of the Power Absorbed in Human Eyes Exposed to Millimetre Waves [temp.]
  EMC'96 ROMA International Symposium on Electromagnetic Compatibility, Rome, Italy. IEEE: pp. 194-199; ISBN 9798331500009
• 1996, Sonaglioni D
  EMC and Broadcasting - the RAI Experience [basics]
  EMC'96 ROMA International Symposium on Electromagnetic Compatibility, Rome, Italy. IEEE: pp. 13-17; ISBN 9798331500009
• 1996, Paperman D, David Y, Martinez M
  [臨床環境におけるEMC（電磁両立性）の試験] [dev./impl.]
  J Clin Eng 21 (3): 207-211
• 1996, Hamilton J
  [電磁干渉は医療機器を誤動作させる可能性がある] [misc.]
  CMAJ 154 (3): 373-375
• 1995, Meier K, Egger O, Schmid T, Kuster N
  Dosimetric Laboratory for Mobile Communications [temp.]
  11th International Zurich Symposium and Technical Exhibition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 297-300; ISBN 978-1-5090-3196-2
• 1995, Ovchinnikov EL, Volobuev AN, Trufanov LA, Romanchuk PI
  Constant Magnetic Field Dosimetry [temp.]
  11th International Zurich Symposium and Technical Exhibition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 271-274; ISBN 978-1-5090-3196-2
• 1995, Chiabrera A, Bianco B, Kaufman JJ
  Biological Effectiveness of Low Intensity Electromagnetic Exposure: Non-Linearity, Out-of-Equilibrium State, and Noise [temp.]
  11th International Zurich Symposium and Technical Exhibition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 151-156; ISBN 978-1-5090-3196-2
• 1995, Bernardi P, Cavagnaro M, Pisa S
  Foot Current as a Parameter Relevant to the Evaluation of the Electromagnetic Exposure Hazard [temp.]
  11th International Zurich Symposium and Technical Exhibition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 121-125; ISBN 978-1-5090-3196-2
• 1995, Joss S, Baumann J, Kreuter U, Stratmann M, Wernli C
  Exposure of the Swiss Population to 50 Hz Magnetic Fields [temp.]
  11th International Zurich Symposium and Technical Exhibition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 267-270; ISBN 978-1-5090-3196-2
• 1995, Anger G
  Measurement of 50 HZ Magnetic Fields From Infant Incubators and Heating Beds. [temp.]
  11th International Zurich Symposium and Technical Exhibition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 133-137; ISBN 978-1-5090-3196-2
• 1995, Nissen J, Paulsson LE
  Magnetic Fields in Swedish Residences and Day Nurseries [temp.]
  11th International Zurich Symposium and Technical Exhibition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 139-143; ISBN 978-1-5090-3196-2
• 1995, Veyret B
  Experimental Studies of Bioeffects of Electromagnetic Fields [temp.]
  11th International Zurich Symposium and Technical Exhibition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 145-150; ISBN 978-1-5090-3196-2
• 1995, Tofani S, D'Amore G, Fiandino G, Benedetto A, Gandhi OP, Chen JY
  [VHFラジオ周波数電磁界にばく露されたヒトの誘導フット電流] [tech./dosim.]
  IEEE Trans Electromagn Compat 37 (1): 96-99
• 1995, Brinkmann K, Kärner HC, Schaefer H
  [生物学的システムの電磁両立性　第4巻：弱い50Hz磁界中での生物システムの電磁両立性] [basics]
  VDE-Verlag; ISBN 978-3-8007-2106-1
• 1995, Gandhi OP, Chen JY
  [試験的6 GHz携帯トランシーバーからヒト頭部への電磁吸収] [tech./dosim.]
  IEEE Trans Electromagn Compat 37 (4): 547-558
• 1994, Santagostino G, Colombo U, Cherbauchich C, Manara A
  Radiated Susceptibility Test. Accuracy and Traceability of the Measurement by Electric Field Sensors [tech./dosim.]
  EMC'94 Roma, International Symposium on Electromagnetic Compatibility, Rome, Italy. IEEE: pp. 359-363; ISBN 978-1-5090-3199-3