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2018,
Sweeney DC, Davalos RV
2018 40th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Honolulu, HI, USA. IEEE: pp. 5850-5853; ISBN 978-1-5386-3647-3
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2018,
Kozlov M, Horner M, Kainz W, Angelone LM
2018 40th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Honolulu, HI, USA. IEEE: pp. 1360-1363; ISBN 978-1-5386-3647-3
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2018,
Hao D, Zhou Y, Gao P, Yang L, Yang Y, Chen F
2018 40th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Honolulu, HI, USA. IEEE: pp. 2174-2177; ISBN 978-1-5386-3647-3
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2018,
Shah AA, Alonso F, Vogel D, Wardell K, Coste J, Lemaire JJ, Pison D, Hemm S
2018 40th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Honolulu, HI, USA. IEEE: pp. 2222-2225; ISBN 978-1-5386-3647-3
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2018,
Zaeimbashi M, Wang Z, Lee SW, Cash S, Fried S, Sun N
2018 40th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Honolulu, HI, USA. IEEE: pp. 2230-2233; ISBN 978-1-5386-3647-3
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2018,
Asan AS, Gok S, Sahin M
2018 40th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Honolulu, HI, USA. IEEE: pp. 2252-2255; ISBN 978-1-5386-3647-3
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2018,
Im C, Seo H, Jun SC
2018 40th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Honolulu, HI, USA. IEEE: pp. 3092-3095; ISBN 978-1-5386-3647-3
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2018 40th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Honolulu, HI, USA. IEEE: pp. 4764-4767; ISBN 978-1-5386-3647-3
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2018,
Zharkova LP, Romanchenko IV, Buldakov MA, Priputnev PV, Bolshakov MA, Rostov VV
2018 20th International Symposium on High-Current Electronics (ISHCE), Tomsk, Russia. IEEE: pp. 158-161; ISBN 978-1-5386-6892-4
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2018,
Knyazeva IR, Medvedev MA, Kutenkov OP, Vasilev AV, Gorokhovsky AA, Rostov VV
2018 20th International Symposium on High-Current Electronics (ISHCE), Tomsk, Russia. IEEE: pp. 94-97; ISBN 978-1-5386-6892-4