-
2018,
Tse NY, Goldsworthy MR, Ridding MC, Coxon JP, Fitzgerald PB, Fornito A, Rogasch NC
Sci Rep 8: 8526
-
2018,
Mioni G, Grondin S, Mapelli D, Stablum F
Sci Rep 8: 10364
-
2018,
Ketz N, Jones AP, Bryant NB, Clark VP, Pilly PK
J Neurosci 38 (33): 7314-7326
-
2018 IEEE IAS Electrical Safety Workshop (ESW), Fort Worth, TX, USA. IEEE: 1-8; ISBN 978-1-5386-1560-7
-
2018,
Ramaraju S, Roula MA, McCarthy PW
J Neural Eng 15 (1): 016019
-
2018,
Taphoorn MJB, Dirven L, Kanner AA, Lavy-Shahaf G, Weinberg U, Taillibert S, Toms SA, Honnorat J, Chen TC, Sroubek J, David C, Idbaih A, Easaw JC, Kim CY, Bruna J, Hottinger AF, Kew Y, Roth P, Desai R, Villano JL, Kirson ED, Ram Z, Stupp R
JAMA Oncol 4 (4): 495-504
-
2018 IEEE Symposium on Product Compliance Engineering (ISPCE), San Jose, CA, USA. IEEE: 1-6; ISBN 978-1-5386-3433-2
-
2018,
McDermott B, Porter E, Hughes D, McGinley B, Lang M, O'Halloran M, Jones M
J Alzheimers Dis 65 (2): 363-392
-
2018,
Sadamitsu S, Leung SW, Lo WK, Sun WN
2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (EMC/APEMC), Suntec City, Singapore. IEEE: 28-31; ISBN 978-1-5090-3955-5
-
2018,
Higuera-Hernández MF, Reyes-Cuapio E, Gutiérrez-Mendoza M, Rocha NB, Veras AB, Budde H, Jesse J, Zaldívar-Rae J, Blanco-Centurión C, Machado S, Murillo-Rodríguez E
Clin Nutr ESPEN 25: 50-55