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19648件の論文が見つかりました。

キーワード: "T wave", T-Welle, T-Zacke, T波

• 2017, Liu CK, Liao WT, Chu YC, Yang CH, Chen KH, Wu CH, Lin CR
  [パルス化無線周波は塩化カリウム共輸送体2の発現の完全フロイントアジュバントによるエピジェネティック抑制を弱める] [med./bio.]
  Pain Med 18 (4): 807-813
• 2017, Zhi WJ, Wang LF, Hu XJ
  [詳細] [マイクロ波放射の脳への影響における最近の進展] [review]
  Mil Med Res 4: 29
• 2017, Cosmas J, Kapovits Á
  Internet of radio light: Unleashing innovation in building networks [basics]
  2017 Global Wireless Summit (GWS), Cape Town, South Africa. IEEE: pp. 257-261; ISBN 978-1-5386-1099-2
• 2017, Cheikh M, Vassilieff Y, Fortes A, Benbouhout R, Foligné H
  [低周波ワイヤレス充電への人体ばく露：直接結合メカニズム及び医療機器との干渉] [tech./dosim.]
  2017 Progress in Electromagnetics Research Symposium - Fall (PIERS - FALL), Singapore. IEEE: pp. 1048-1054; ISBN 978-1-5386-1211-8
• 2017, Jain S, Baratchi S, Pirogova E
  [低電力マイクロ波はTrpv4イオンチャネルタンパク質のゲート機能に変化を生じる] [med./bio.]
  2017 Progress in Electromagnetics Research Symposium - Fall (PIERS - FALL), Singapore. IEEE: pp. 1268-1272; ISBN 978-1-5386-1211-8
• 2017, Marshall TG, Heil TJR
  Electrosmog and autoimmune disease [med./bio.]
  Immunol Res 65 (1): 129-135
• 2017, Gao YH, Zhou YF, Li SF, Li WY, Xi HR, Yang FF, Chen KM
  [成長途上のラットの骨密度に対する50 Hz、1.8 mTの正弦波電磁界の影響] [foreign-language]
  Zhongguo Gu Shang 30 (12): 1113-1117
• 2017, Lee YS, Choi HD
  Plane wave integral representations inside a reveberation chamber having field anisotropy [tech./dosim.]
  2017 IEEE Conference on Antenna Measurements & Applications (CAMA), Tsukuba, Japan. IEEE, Tsukuba, Japan: pp. 142-143; ISBN 978-1-5090-5029-1
• 2017, Yonemoto N, Otagaki Y, Kakubari Y, Ikeda K, Murata H
  MMW remote antenna system of vector network analyzer for propagation measurement in stadium [tech./dosim.]
  2017 IEEE Conference on Antenna Measurements & Applications (CAMA), Tsukuba, Japan. IEEE, Tsukuba, Japan: pp. 337-340; ISBN 978-1-5090-5029-1
• 2017, Monebhurrun V
  Numerical and experimental investigations of radio wave propagation at 2450 MHz for optimum network coverage [tech./dosim.]
  2017 IEEE Conference on Antenna Measurements & Applications (CAMA), Tsukuba, Japan. IEEE, Tsukuba, Japan: pp. 118-119; ISBN 978-1-5090-5029-1