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6160件の論文が見つかりました。

キーワード: "Institute of Electrical and Electronics Engineers", IEEE, 米国電気電子学会

• 2009, Simba AY, Hikage T, Watanabe S, Nojima T
  [エレベータ内で使用の携帯電話からのRF電磁界にばく露した解剖学的現実性のある人体モデルにおける比吸収率] [tech./dosim.]
  IEEE Trans Microw Theory Tech 57 (5): 1250-1259
• 2009, Findlay RP, Dimbylow PJ
  [65MHz-2GHzにおける半波長ダイポールアンテナからの電磁界の空間平均とそれに対応する人体ボクセルモデルNORMANでのSAR計算] [tech./dosim.]
  Phys Med Biol 54 (8): 2437-2447
• 2009, Ilvonen S, Laakso I
  [回転する頭部における磁気誘導電界の計算による評価] [tech./dosim.]
  Phys Med Biol 54 (2): 341-351
• 2009, Pucihar G, Miklavcic D, Kotnik T
  [不定形細胞での膜貫通電圧誘導および電気穿孔に関する時間依存性数値モデル] [tech./dosim.]
  IEEE Trans Biomed Eng 56 (5): 1491-1501
• 2008, Klimov AI, Kovalchuk OB, Rostov VV, Sinyakov AN
  Measurement of Parameters of X-Band High-Power Microwave Superradiative Pulses [tech./dosim.]
  IEEE Trans Plasma Sci 36 (3): 661-664
• 2008, Rusnani A, Norhayati MN, Siti Noraini S, Marina M
  Microwave radiation effect - a test on white mice [med./bio.]
  2008 IEEE International RF and Microwave Conference, Kuala Lumpur, Malaysia. IEEE: pp. 262-267; ISBN 978-1-4244-2867-0
• 2008, Paulraj R, Behari J
  Biochemical biophysical changes of rats brain exposed to low intensity microwave radiation [med./bio.]
  2008 International Conference on Recent Advances in Microwave Theory and Applications, Jaipur, India. IEEE: pp. 561-563; ISBN 978-1-4244-2691-1
• 2008, Pisa S, Calcagnini G, Cavagnaro M, Piuzzi E, Mattei E, Bernardi P
  A Study of the Interaction Between Implanted Pacemakers and the Radio-Frequency Field Produced by Magnetic Resonance Imaging Apparatus [dev./impl.]
  IEEE Trans Electromagn Compat 50 (1): 35-42
• 2008, Kong S, Choi D, Oh H
  Evaluation of human exposure to electromagnetic fields from RFID devices at 13.56 MHz [tech./dosim.]
  2008 Asia-Pacific Microwave Conference, Hong Kong, China. IEEE: pp. 1-4; ISBN 978-1-4244-2642-3
• 2008, Yang L, Guizhen L
  The research on biological effects of mobile phone radiation to human body [tech./dosim.]
  2008 Asia-Pacific Microwave Conference, Hong Kong, China. IEEE: pp. 1-4; ISBN 978-1-4244-2642-3