キーワード:
"Institute of Electrical and Electronics Engineers", IEEE, 米国電気電子学会
-
2016,
Cruciani S, Campi T, Feliziani M
2016 46th European Microwave Conference (EuMC), London, UK. IEEE: pp. 703-706; ISBN 978-1-5090-1514-6
-
2016,
Canova A, Freschi F, Giaccone L
2016 IEEE Industry Applications Society Annual Meeting, Portland, OR, USA. IEEE: pp. 1-7; ISBN 978-1-4799-8398-8
-
2016,
Kanemaki M, Shimizu HO, Kitama M, Yamashita M, Miura H, Shimizu K
2016 Progress in Electromagnetic Research Symposium (PIERS), Shanghai, China. IEEE: pp. 1115-1118; ISBN 978-1-5090-6094-8
-
2016,
Mazur E, Sieron-Stoltny K, Cieslar G, Sieron A, Sowa P
2016 Progress in Electromagnetic Research Symposium (PIERS), Shanghai, China. IEEE: pp. 5027-5031; ISBN 978-1-5090-6094-8
-
2016,
Jiang S, Zhang X, Yuan Z, Wu X
2016 Progress in Electromagnetic Research Symposium (PIERS), Shanghai, China. IEEE: pp. 5199-5205; ISBN 978-1-5090-6094-8
-
2016,
Korobeynikov SM, Akramova MS, Akramov BK
2016 2nd International Conference on Industrial Engineering, Applications and Manufacturing (ICIEAM), Chelyabinsk, Russia. IEEE: pp. 1-4; ISBN 978-1-5090-1323-4
-
2016,
Salceanu A, Poenaru MM, Anghel MA, Paulet M
21st IMEKO TC-4 International Symposium on Understanding the World through Electrical and Electronic Measurement, and 19th International Workshop on ADC Modelling and Testing 2016 : Budapest, Hungary, 7-9 September 2016. Curran Associates, Red Hook, NY: pp. 32-36
-
2016,
Salceanu A, Lunca E, Neacsu O, Iacobescu F
2016 International Conference and Exposition on Electrical and Power Engineering (EPE), Iasi, Romania. International Conference and Exposition on Electrical and Power Engineering; IEEE: pp. 592-597
-
2016,
Cobianu C, Fidel N, Stan MF, Husu AG
2016 8th International Conference on Electronics, Computers and Artificial Intelligence (ECAI), Ploiesti, Romania. IEEE: pp. 1-6; ISBN 978-1-5090-2048-5
-
2016,
Frezzi P, Hug R, Grant J, Klingler A
2016 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Wroclaw, Poland. IEEE: pp. 876-881; ISBN 978-1-5090-1417-0