2024 American Control Conference (ACC), Toronto, ON, Canada. IEEE: pp. 4536-4541; ISBN 9798350382662
2024,
Turuban M, Kromhout H, Vila J, Vallbona-Vistós M, de Vocht F, Baldi I, Richardson L, Benke G, Krewski D, Parent ME, Sadetzki S, Schlehofer B, Schüz J, Siemiatycki J, van Tongeren M, Woodward A, Cardis E, Turner MC