15th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 289-292; ISBN 978-1-5090-3197-9
2003,
Haarala C, Aalto S, Hautzel H, Julkunen L, Rinne JO, Laine M, Krause B, Hämäläinen H