Exposure to the near Field of an RF Plastic Sealer
tech./dosim.
著者:
Kamimura Y, Tokushige K
掲載誌: 8th International Zurich Symposium and Technical Exhibition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE, 1989: pp. 531-536; ISBN 978-1-5090-3193-1
