Induced Voltage & Current Simulations, Safety Criterion, and Mitigations for EHV Transmission Lines in Close Proximity tech./dosim.

著者: Wu X, Meisner DJ, Stechschulte KD, Simha V, Wellman RJ, Thakur M, Posey KR
掲載誌: 2018 IEEE Industry Applications Society Annual Meeting (IAS), Portland, OR, USA. IEEE, 2018: pp. 1-8; ISBN 978-1-5386-4537-6
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