H-Field Probe with Active Balun for MRI-Conditional Testing of Medical Devices
tech./dosim.
著者:
Attaran A, Handler WB, Chronik BA
掲載誌: 2018 IEEE 61st International Midwest Symposium on Circuits and Systems (MWSCAS), Windsor, ON, Canada. IEEE, 2018: pp. 45-48; ISBN 978-1-5386-7393-5
