64 MHz RF Exposure System for Testing of Implanted Medical Devices in MRI Applications tech./dosim.

著者: Davieau KJ, Attaran A, Chronik BA
掲載誌: 2019 IEEE Canadian Conference of Electrical and Computer Engineering (CCECE), Edmonton, AB, Canada. IEEE, 2019: pp. 1-3; ISBN 978-1-7281-0320-4
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