著者:
Bandini G, Buffi A, Marracci M, Tellini B, Rizzo T, Macucci M, Strangio S, Iannaccone G
掲載誌: 2023 IEEE International Instrumentation and Measurement Technology Conference (I2MTC), Kuala Lumpur, Malaysia. IEEE, 2023: pp. 1-6; ISBN 978-1-6654-5384-4
