[電磁界ばく露の尺度としてのスマートフォンの物理層測定値の解釈] tech./dosim.

Interpretation of the Physical Layer Measurements of Smartphones as Measures of Exposure to Electromagnetic Fields

著者: Schießl S, Kopacz T, Heberling D
掲載誌: 2020 14th European Conference on Antennas and Propagation (EuCAP), Copenhagen, Denmark. IEEE, 2020: pp. 1-5; ISBN 978-1-7281-3712-4
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