-
1980,
Blackman CF, Benane SG, Joines WT, Hollis MA, House DE
Bioelectromagnetics 1 (3): 277-283
-
1980,
Cannistraro S, Martino G, Sportelli L
Radiat Environ Biophys 18 (2): 123-128
-
1980,
Hjeresen DL, Kaune WT, Decker JR, Phillips RD
Bioelectromagnetics 1 (3): 299-312
-
1980,
Lebovitz RM, Seaman RL
Bioelectromagnetics 1 (4): 415-428
-
1980,
de Lorge JO, Ezell CS
Bioelectromagnetics 1 (2): 183-198
-
1980,
Schrot J, Thomas JR, Banvard RA
Bioelectromagnetics 1 (1): 89-99
-
1980,
Carroll DR, Levinson DM, Justesen DR, Clarke RL
Bioelectromagnetics 1 (2): 101-115
-
1980,
Preston E, Prefontaine G
J Appl Physiol Respir Environ Exerc Physiol 49 (2): 218-223
-
Bioelectromagnetics 1 (3): 313-323
-
1979,
Quboa K, Al Hafid HT, Gupta SC
3rd Symposium and Technical Exhibition on Electromagnetic Compatibility, Rotterdam, Rotterdam, South Holland, Netherlands. IEEE: pp. 19-22; ISBN 9798331500207
-
1979,
Duk I, Swietlikowski M, Grabiec S
Bull Acad Pol Sci Biol 27 (3): 223-227
-
1979,
Dokovic V, Dordevic Z, Lazarevic N
Acta Vet-Beogr 29 (3-4): 121-128
-
1979,
Klimovskaia LD, Krotova SB
Kosm Biol Aviakosm Med 13 (6): 58-61
-
1979,
Cerdonio M, Morante-Mazzoncini S, Vicentini-Missoni M
Can J Plant Sci 59 (3): 883-885
-
1979,
Photiades DP, Osamo NO
Radio Sci 14 (6) Suppl: 311 - 312
-
Radio Sci 14 (6) Suppl: 193 - 197
-
1979,
Lövsund P, Öberg PÅ, Nilsson SEG
Radio Sci 14 (6) Suppl: 125 - 126
-
1979,
Greenebaum B, Goodman EM, Marron MT
Radio Sci 14 (6) Suppl: 103 - 107
-
1979,
Sagan PM, Medici RG
Radio Sci 14 (6) Suppl: 239 - 245
-
Radio Sci 14 (6 S): 1 - 4
-
1979,
McRee DI, Wachtel H
Radio Sci 14 (6) Suppl: 75 - 79
-
1979,
Massoudi H, Durney CH, Johnson CC
Radio Sci 14 (6) Suppl: 35 - 42
-
1979,
Whitcomb ER, Blackman CF, Weil CM
Radio Sci 14 (6) Suppl: 155 - 158
-
1979,
Tell RA, Mantiply ED
1979 IEEE International Symposium on Electromagnetic Compatibility, San Diego, CA, USA. IEEE: pp. 252-256; ISBN 978-1-5090-3165-8
-
1979,
Sikov MR, Mahlum DD, Montgomery LD, Decker JR
Biological Effects of Extremely Low Frequency Electromagnetic Fields. Techn. Informations Center: pp. 462-473; ISBN 978-0-87079-118-5