The following terms were included:
co-exposure, Co-Exposition, Ko-Exposition, 共ばく露
-
1988,
d'Ambrosio G, Massa R, Di Berardino D, Lioi MB, Scaglione A, Scarfi MR
J Bioelectricity 7 (2): 239-245
-
O'Connor ME, Lovely RH (eds.): Electromagnetic Fields and Neurobehavioral Function. Progress in Clinical and Biological Research, volume 257; Alan R. Liss, Inc., New York; pp. 309-326; ISBN 978-0-8451-5107-5
-
1988,
Jauchem JR, Frei MR, Heinmets F
Physiol Chem Phys Med NMR 20 (2): 135-143
-
1988,
Patil AA, Yamanashi WS, Valentine JL, Hill D
Neurosurgery 22 (1) Pt 1: 18-22
-
1987,
Lai H, Horita A, Chou CK, Guy AW
IEEE Eng Med Biol Mag 6: 31-36
-
1987,
Ngo FQ, Blue JW, Roberts WK
Magn Reson Med 5 (4): 307-317
-
1987,
Meltz ML, Walker KA, Erwin DN
Radiat Res 110 (2): 255-266
-
1987,
Bailey WH, Charry JM
Bioelectromagnetics 8 (2): 173-181
-
J Comp Physiol A 159 (5): 619-625
-
Am J Vet Res 47 (10): 2155-2160
-
1986,
Roux C, Elefant E, Gaboriaud G, Jaullery C, Gardette J, Dupuis R, Lambert D
Radiat Res 108 (3): 317-326
-
1986,
Whitson GL, Carrier WL, Francis AA, Shih CC, Georghiou S, Regan JD
Cell Tissue Kinet 19 (1): 39-47
-
1986,
Bawin SM, Abu-Assal ML, Sheppard AR, Mahoney MD, Adey WR
Brain Res 399 (1): 194-199
-
1986,
Bailey WH, Charry JM
Bioelectromagnetics 7 (3): 329-339
-
1986,
Thomas JR, Schrot J, Liboff AR
Bioelectromagnetics 7 (4): 349-357
-
Bioelectromagnetics 7 (4): 405-414
-
1985,
Kellogg 3rd EW, Yost MG, Reed EJ, Madin SH
Int J Biometeorol 29 (3): 269-283
-
1985,
Stabrowski A, Nollen PM
Int J Parasitol 15 (5): 551-555
-
1985,
Kellogg 3rd EW, Yost MG, Reed EJ
Int J Biometeorol 29 (3): 253-268
-
1985,
Subrahmanyam S, Narayan PV, Srinivasan TM
Int J Biometeorol 29 (3): 293-305
-
1985,
Zecca L, Dal Conte G, Furia G, Ferrario P
Bioelectrochem Bioenerg 14 (1-3): 39-43
-
1985,
McCormack PD, Swenberg CE
Radiat Res 104 (3): 293-302
-
1985,
Balcer-Kubiczek EK, Harrison GH
Carcinogenesis 6 (6): 859-864
-
1985,
Charry JM, Bailey WH
Bioelectromagnetics 6 (4): 415-425
-
Seventh International Wroclaw Symposium on Electromagnetic Compatibility, Wroclaw, Poland. IEEE: pp. 665-672